{"title":"A 9b, 1.25ps Resolution Coarse-Fine Time-to-Digital Converter in 90nm CMOS that Amplifies a Time Residue","authors":"Minjae Lee, A. Abidi","doi":"10.1109/VLSIC.2007.4342701","DOIUrl":"https://doi.org/10.1109/VLSIC.2007.4342701","url":null,"abstract":"A 9 b 1.25 ps two step time-to-digital converter is implemented in 90 nm CMOS. It uses a new circuit to amplify the time residue, and compensates mismatch with subrange normalization. DNL and INL are, respectively, plusmn0.8 LSB and plusmn2 LSB. It can be used as a phase detector with digital output.","PeriodicalId":261092,"journal":{"name":"2007 IEEE Symposium on VLSI Circuits","volume":"144 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129568053","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A 0.5V 8bit 10Msps Pipelined ADC in 90nm CMOS","authors":"Junhua Shen, P. Kinget","doi":"10.1109/VLSIC.2007.4342715","DOIUrl":"https://doi.org/10.1109/VLSIC.2007.4342715","url":null,"abstract":"A true low voltage 0.5 V 8 bit pipelined A/D converter is realized in 90 nm CMOS technology using regular Vtau devices. A cascaded sampling technique is used to combat the OFF leakage of the switches. The converter prototype occupies 0.85 mm2; operating at 10 Msps, it consumes 2.4 mW and achieves an SNDR of 48.1 dB with a 0.4 Vppdiff full-scale input.","PeriodicalId":261092,"journal":{"name":"2007 IEEE Symposium on VLSI Circuits","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125972861","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A CMOS Readout Circuit for Silicon Resonant Accelerometer with 32-ppb bias stability","authors":"Lin He, Y. Xu, M. Palaniapan","doi":"10.1109/VLSIC.2007.4342692","DOIUrl":"https://doi.org/10.1109/VLSIC.2007.4342692","url":null,"abstract":"This paper describes a fully-differential CMOS readout circuit for silicon micro-resonant accelerometer. Tested with a SOI resonator, the readout chip sustains the oscillation at 110 kHz with a phase noise of -36 dBc@1 Hz and a bias stability of 0.0035 Hz or 32 ppb, which can be translated to an amplitude noise of 1 Aring/radicHz down to 0.05 Hz and stability of 0.22 Aring up to 100 seconds. The chip is fabricated in a 0.35-mum CMOS process and draws 5 mA under a 3.3-V single supply.","PeriodicalId":261092,"journal":{"name":"2007 IEEE Symposium on VLSI Circuits","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122214271","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Fully Integrated 36MHz to 230MHz Multiplying DLL with Adaptive Current Tuning","authors":"Keng-Jan Hsiao, Tai-Cheng Lee","doi":"10.1109/VLSIC.2007.4342730","DOIUrl":"https://doi.org/10.1109/VLSIC.2007.4342730","url":null,"abstract":"A multiplying-DLL based frequency synthesizer with a fully-integrated loop capacitor employs an adaptive current adjusting loop to generate a low-jitter clock for LCD panel applications. The measured RMS jitter is 3.5 ps for 229.5-MHz output clock. The frequency synthesizer occupies 0.09 mm2 active area in a 0.18-mum CMOS technology and consumes 9 mW from a 1.8-V supply.","PeriodicalId":261092,"journal":{"name":"2007 IEEE Symposium on VLSI Circuits","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123911276","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Ali Agahl, K. Vleugels, Peter B. Griffin, Mostafa Ronaghi, James D. Plummer, B. Wooley
{"title":"A High-Resolution Low-Power Oversampling ADC with Extended-Range for Bio-Sensor Arrays","authors":"Ali Agahl, K. Vleugels, Peter B. Griffin, Mostafa Ronaghi, James D. Plummer, B. Wooley","doi":"10.1109/VLSIC.2007.4342736","DOIUrl":"https://doi.org/10.1109/VLSIC.2007.4342736","url":null,"abstract":"A calibration-free, high-resolution ADC designed for bioluminescence sensing employs an extended-counting architecture in which the residual error from a second-order incremental SigmaDelta modulator is encoded using a successive approximation ADC. The ADC has been integrated in 0.18-mum CMOS technology and achieves a dynamic range of 90.1 dB and a peak SNDR of 86.3 dB at a conversion rate of 1MSample/sec with 38 mW power consumption.","PeriodicalId":261092,"journal":{"name":"2007 IEEE Symposium on VLSI Circuits","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126344234","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A 2.4GHz ISM-band digital CMOS wireless transceiver with an intra-symbol adaptively intermittent Rx","authors":"H. Ishizaki, K. Nose, M. Mizuno","doi":"10.1109/VLSIC.2007.4342775","DOIUrl":"https://doi.org/10.1109/VLSIC.2007.4342775","url":null,"abstract":"The first achievement of intra-symbol adaptively intermittent receiver has been developed with an inductor-less LNA by 90-nm digital CMOS, and Rx characteristics have been measured (Rx power: 4.5 mW, BER: 4.1times10-5, received signal intensity: -73 dBm, when Rx is enabled within only 8.2% of a single symbol period) with an on-chip stair-like shaping PA (3rd order harmonics of -40.6 dBc) and a digitally controlled direct RF carrier phase modulator (ACPR<-40 dBc).","PeriodicalId":261092,"journal":{"name":"2007 IEEE Symposium on VLSI Circuits","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132263193","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A 150MS/s 14-bit Segmented DEM DAC with Greater than 83dB of SFDR Across the Nyquilst band","authors":"Kok Lim Chan, Jianyu Zhu, I. Galton","doi":"10.1109/VLSIC.2007.4342714","DOIUrl":"https://doi.org/10.1109/VLSIC.2007.4342714","url":null,"abstract":"A segmented DEM technique that allows an efficient tradeoff between encoder complexity and the number of unit current-steering cells enables a 150 MS/s DAC with greater than 83 dB of SFDR across the Nyquist band. The 0.18 mum CMOS IC has an active area of 3 mm2 and dissipates 127 mW.","PeriodicalId":261092,"journal":{"name":"2007 IEEE Symposium on VLSI Circuits","volume":"217 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133584187","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Shine C. Chung, Jiann-Tseng Huang, P. Chen, F. Hsueh
{"title":"A 512×8 electrical fuse memory with 15μm2 cells using 8-sq asymmetric fuse and core devices in 90nm CMOS","authors":"Shine C. Chung, Jiann-Tseng Huang, P. Chen, F. Hsueh","doi":"10.1109/VLSIC.2007.4342771","DOIUrl":"https://doi.org/10.1109/VLSIC.2007.4342771","url":null,"abstract":"A 15 μm2 cell 4 Kb electrical fuse memory is designed in 90 nm CMOS using core devices only. The N+ 8-sq asymmetric fuses are used to enhance fuse uniformity, reliability, and aggregate electro-migration. High-gain cascade amplifiers sense small resistance differences to achieve a 2.25 V program voltage in 1 mus. A sufficient design window is derived and verified by using on-chip resistance monitor without area overheads.","PeriodicalId":261092,"journal":{"name":"2007 IEEE Symposium on VLSI Circuits","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128992697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
K. Ueno, H. Murakami, N. Yano, R. Okuda, T. Himeno, T. Kamei, Y. Urakawa
{"title":"A Design Methodology Realizing an Over GHz Synthesizable Streaming Processing Unit","authors":"K. Ueno, H. Murakami, N. Yano, R. Okuda, T. Himeno, T. Kamei, Y. Urakawa","doi":"10.1109/VLSIC.2007.4342761","DOIUrl":"https://doi.org/10.1109/VLSIC.2007.4342761","url":null,"abstract":"A 7.07 mm2 synthesizable streaming processing unit (SPU) is fabricated in a 65 nm CMOS technology with 8 level copper layers. It is migrated from its original custom design to a synthesizable design to get higher design portability. New features are a new floor plan, height optimized standard cell library, local clock generator cloning and adaptive wire width control. Its logic area is 30% smaller than the full custom designed SPU in the same process generation. Correct functional operation is realized in 4 GHz at 1.4 V.","PeriodicalId":261092,"journal":{"name":"2007 IEEE Symposium on VLSI Circuits","volume":"125 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131667852","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. Ishikura, M. Kurumada, T. Terano, Y. Yamagami, N. Kotani, K. Satomi, K. Nii, M. Yabuuchi, Y. Tsukamoto, S. Ohbayashi, T. Oashi, H. Makino, H. Shinohara, H. Akamatsu
{"title":"A 45nm 2port 8T-SRAM using hierarchical replica bitline technique with immunity from simultaneous R/W access issues","authors":"S. Ishikura, M. Kurumada, T. Terano, Y. Yamagami, N. Kotani, K. Satomi, K. Nii, M. Yabuuchi, Y. Tsukamoto, S. Ohbayashi, T. Oashi, H. Makino, H. Shinohara, H. Akamatsu","doi":"10.1109/VLSIC.2007.4342740","DOIUrl":"https://doi.org/10.1109/VLSIC.2007.4342740","url":null,"abstract":"We propose a new 2port (2P) SRAM with an 8T single-bit-line (SBL) memory cell for 45 nm SOCs. Access time tends to be slower as the device size is scaled down because of the random threshold-voltage variations. The Divided read Bit line scheme with Shared local Amplifier (DBSA) realizes fast access time without increasing area penalty. We also show an additional important issue of a simultaneous Read and Write (R/W) access at the same row by using DBSA with the 8 T-SBL memory cell. A rise of the storage node voltage causes the misreading. The Read End detecting Replica circuit (RER) and the Local read bit line with Dummy Capacitance (LDC) are introduced to solve this issue. A 128 BLtimes512WL 64Kb 2P-SRAM macro which cell size is 0.597mum2 using these schemes was fabricated by 45 nm LSTP CMOS process.","PeriodicalId":261092,"journal":{"name":"2007 IEEE Symposium on VLSI Circuits","volume":"134 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123156867","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}