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Corrections to “Label Free DNA Detection Techniques Using Dielectric Modulated FET: Inversion or Tunneling?”
IF 4.3 2区 综合性期刊
IEEE Sensors Journal Pub Date : 2025-04-01 DOI: 10.1109/JSEN.2025.3533876
Rathlavath Priyanka;L. Chandrasekar;Rameez Raja Shaik;Kumar Prasannajit Pradhan
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引用次数: 0
IEEE Sensors Council
IF 4.3 2区 综合性期刊
IEEE Sensors Journal Pub Date : 2025-04-01 DOI: 10.1109/JSEN.2025.3552292
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引用次数: 0
IEEE Collabratec
IF 8.6 1区 工程技术
IEEE Transactions on Sustainable Energy Pub Date : 2025-03-21 DOI: 10.1109/TSTE.2025.3553211
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引用次数: 0
IEEE Transactions on Sustainable Energy Information for Authors
IF 8.6 1区 工程技术
IEEE Transactions on Sustainable Energy Pub Date : 2025-03-21 DOI: 10.1109/TSTE.2025.3547404
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引用次数: 0
IEEE Industry Applications Society Information
IF 8.6 1区 工程技术
IEEE Transactions on Sustainable Energy Pub Date : 2025-03-21 DOI: 10.1109/TSTE.2025.3547402
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引用次数: 0
Share Your Preprint Research with the World!
IF 8.6 1区 工程技术
IEEE Transactions on Sustainable Energy Pub Date : 2025-03-21 DOI: 10.1109/TSTE.2025.3553209
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引用次数: 0
IEEE Transactions on Sustainable Energy Publication Information
IF 8.6 1区 工程技术
IEEE Transactions on Sustainable Energy Pub Date : 2025-03-21 DOI: 10.1109/TSTE.2025.3547400
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引用次数: 0
Call for Nominations for Editor-in-Chief IEEE Transactions on Semiconductor Manufacturing
IF 2.5 3区 工程技术
IEEE Transactions on Device and Materials Reliability Pub Date : 2025-03-19 DOI: 10.1109/TDMR.2025.3535976
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引用次数: 0
Announcing an IEEE/Optica Publishing Group Journal of Lightwave Technology Special Issue on: OFS-29
IF 2.5 3区 工程技术
IEEE Transactions on Device and Materials Reliability Pub Date : 2025-03-19 DOI: 10.1109/TDMR.2025.3551113
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引用次数: 0
IEEE Transactions on Device and Materials Reliability Information for Authors
IF 2.5 3区 工程技术
IEEE Transactions on Device and Materials Reliability Pub Date : 2025-03-19 DOI: 10.1109/TDMR.2025.3549643
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引用次数: 0
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