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N-DIBL optimization of NC-GAAFET NW for low power fast switching applications 针对低功耗快速开关应用的 NC-GAAFET NW 的 N-DIBL 优化
IF 1.9 3区 工程技术
Microelectronics Journal Pub Date : 2024-07-24 DOI: 10.1016/j.mejo.2024.106321
{"title":"N-DIBL optimization of NC-GAAFET NW for low power fast switching applications","authors":"","doi":"10.1016/j.mejo.2024.106321","DOIUrl":"10.1016/j.mejo.2024.106321","url":null,"abstract":"<div><p>Gate-all-around field effect transistors (GAAFETs), exhibit improved SCEs, are proposed to replace conventional FinFET in scaled nanodevices owing to excellent gate control. The voltage scaling concept is embodied in negative capacitance (NC) which provides same on current at reduced voltage. The proposed NC-GAAFET yields 5.31 times larger I<sub>ON</sub> and I<sub>OFF</sub> is significantly reduced by ⁓10<sup>5</sup> orders, which is due NC effect, compared to baseline NW. SS<sub>avg</sub> for the NC-GAAFET is 33mV/dec which surpasses Boltzmann tyranny and manifests steep subthreshold behavior. Effect of FE thickness (t<sub>fe</sub>) variations on DIBL has been explored and found to be negative, which improves SCEs. The negative-DIBL for device has been found to be −20 mV/V at t<sub>fe</sub> = 6 nm. Furthermore, a CMOS inverter circuit employing the NC-GAAFET has been presented that provides an average propagation delay of 174 fS which is 47 % lesser as compared to that of baseline device. The NC-GAAFET NW findings fulfill the quest of low power fast switching device for digital applications.</p></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2024-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141844271","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A 0.91-μA-quiescent-current capacitor-less LDO with sub-threshold transient enhancement and bulk-driven feed-forward supply ripple cancellation 静态电流为 0.91μA 的无电容 LDO,具有亚阈值瞬态增强和批量驱动前馈电源纹波消除功能
IF 1.9 3区 工程技术
Microelectronics Journal Pub Date : 2024-07-23 DOI: 10.1016/j.mejo.2024.106311
{"title":"A 0.91-μA-quiescent-current capacitor-less LDO with sub-threshold transient enhancement and bulk-driven feed-forward supply ripple cancellation","authors":"","doi":"10.1016/j.mejo.2024.106311","DOIUrl":"10.1016/j.mejo.2024.106311","url":null,"abstract":"<div><p>This paper presents a capacitor-less low-dropout (OCL-LDO) regulator that features a low quiescent current for low power applications. To enhance the transient response of proposed OCL-LDO, a sub-threshold transient enhancement circuit including a transient signal input stage, a current subtractor, and a current amplifier is suggested. Meanwhile, a circuit made up of a bulk-driven ripple feed-forward circuit and a ripple introduction circuit is developed in order to improve PSR of the OCL-LDO. The proposed OCL-LDO is fabricated in 0.18 <span><math><mi>μ</mi></math></span>m standard CMOS process and has an active area of 0.053 mm<sup>2</sup>. Based on measurement results, the proposed OCL-LDO has a maximum load current of 100 mA at 1.2 V input and 1 V output, and a minimum quiescent current of 0.91 <span><math><mi>μ</mi></math></span>A. The overshoot voltage and undershoot voltage are 199 mV and 204 mV, respectively. PSR of the OCL-LDO is <span><math><mo>−</mo></math></span>71.8 dB at 1 KHz when the load current is 100 mA. Furthermore, the OCL-LDO exhibits a load regulation of 11.1 <span><math><mi>μ</mi></math></span>V/mA and a line regulation of 1.05 mV/V.</p></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2024-07-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141849731","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A reconfigurable multi-precision quantization-aware nonlinear activation function hardware module for DNNs 用于 DNN 的可重构多精度量化感知非线性激活函数硬件模块
IF 1.9 3区 工程技术
Microelectronics Journal Pub Date : 2024-07-22 DOI: 10.1016/j.mejo.2024.106346
{"title":"A reconfigurable multi-precision quantization-aware nonlinear activation function hardware module for DNNs","authors":"","doi":"10.1016/j.mejo.2024.106346","DOIUrl":"10.1016/j.mejo.2024.106346","url":null,"abstract":"<div><p>In recent years, the increasing variety of nonlinear activation functions (NAFs) in deep neural networks (DNNs) has led to higher computational demands. However, hardware implementation faces challenges such as lack of flexibility, high hardware cost, and limited accuracy. This paper proposes a highly flexible and low-cost hardware solution for implementing activation functions to overcome these issues. Based on the piecewise linear (PWL) approximation method, our method supports NAFs with different accuracy configurations through a customized implementation strategy to meet the requirements in different scenario applications. In this paper, the symmetry of the activation function is investigated, and incorporate curve translation preprocessing and data quantization to significantly reduce hardware storage costs. The modular hardware architecture proposed in this study supports NAFs of multiple accuracies, which is suitable for designing deep learning neural network accelerators in various scenarios, avoiding the need to design dedicated hardware circuits for the activation function layer and enhances circuit design efficiency. The proposed hardware architecture is validated on the Xilinx XC7Z010 development board. The experimental results show that the average absolute error (AAE) is reduced by about 35.6 % at a clock frequency of 312.5 MHz. Additionally, the accuracy loss of the model is maximized to −0.684 % after replacing the activation layer function of DNNs under the PyTorch framework.</p></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2024-07-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141841666","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Ambipolar current suppression in drain elevated TFET using a novel extended drain structure with a moderate doping profile 利用具有适度掺杂特征的新型扩展漏极结构抑制漏极升高型 TFET 中的两极电流
IF 1.9 3区 工程技术
Microelectronics Journal Pub Date : 2024-07-22 DOI: 10.1016/j.mejo.2024.106302
{"title":"Ambipolar current suppression in drain elevated TFET using a novel extended drain structure with a moderate doping profile","authors":"","doi":"10.1016/j.mejo.2024.106302","DOIUrl":"10.1016/j.mejo.2024.106302","url":null,"abstract":"<div><p>In this paper, a simple and compact silicon-based Elevated and Extended Drain with Hetero-Dielectric Gate Oxide TFET (EED HDGO TFET) is proposed to suppress the ambipolar current in Elevated Drain TFET (ED TFET). The proposed device structure uses a moderately doped drain with a doping concentration of <span><math><mo>∼</mo></math></span>10<sup>18</sup> cm<sup>−3</sup> and a high drain length of <span><math><mo>∼</mo></math></span>50–100 nm. The combination of the moderate drain doping profile and the extended drain length reduced the impact of the electrostatic potential from the positive voltage of the drain electrode on the channel–drain junction. This structural technique widens the tunneling width at the channel–drain region causing the tunneling current to decrease significantly. The tunneling width is further increased by structurally isolating the channel–drain junction region from the gate electrode. Thus, distancing the channel–drain junction from both the gate electric field and the static drain potential of the drain electrode causes full suppression of the ambipolar (I<sub>amb</sub>) current. The proposed structure yields I<sub>amb</sub> and I<sub>off</sub> as low as <span><math><mo>∼</mo></math></span>10<sup>−18</sup> A/<span><math><mrow><mi>μ</mi><mi>m</mi></mrow></math></span> and <span><math><mo>∼</mo></math></span>10<sup>−17</sup> A/<span><math><mrow><mi>μ</mi><mi>m</mi></mrow></math></span> respectively, while maintaining the I<sub>on</sub> as <span><math><mo>∼</mo></math></span>0.3 mA. The device is optimized for low power and high-speed digital circuits through intensive parametric analysis on gate–drain C<sub>gd</sub> and the gate–source C<sub>gs</sub> capacitances for various device parameters.</p></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2024-07-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141852291","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An 8b-Precison 16-Kb FDSOI 8T SRAM CIM macro based on time-domain for energy-efficient edge AI devices 基于时域的 8b-precison 16-Kb FDSOI 8T SRAM CIM 宏,用于高能效边缘人工智能设备
IF 1.9 3区 工程技术
Microelectronics Journal Pub Date : 2024-07-21 DOI: 10.1016/j.mejo.2024.106308
{"title":"An 8b-Precison 16-Kb FDSOI 8T SRAM CIM macro based on time-domain for energy-efficient edge AI devices","authors":"","doi":"10.1016/j.mejo.2024.106308","DOIUrl":"10.1016/j.mejo.2024.106308","url":null,"abstract":"<div><p>Compute-in-memory has been increasingly appreciated by researchers as a well-suited hardware accelerator in convolutional neural networks (CNNs), because it can achieve low power consumption and high inference accuracy. This work presents a novel TD-CIM structure using:1) A Capacitor Charging scheme that uses Compact 8T Model for multiply-and-accumulate (MAC) Operations with serials inputs in Time Domain Level; 2) a new replicated bit-line time-domain converter (RBL-TDC) to achieve the quantization of the multiply-accumulate operations with high accuracy; 3) A 22 nm FD-SOI 16 Kb TD-CIM macro fabricated using foundry provided compact 8T-SRAM cells, which achieves normalized energy efficiency(EF) of 5816.5 TOPS/W, normalized area efficiency(64TOPS/mm<sup>2</sup>), and 8-bit weight for 8-bit serials inputs with 64 accumulations per cycle, as well as output precision(14b) in the MAC operation. This work also obtains an inference accuracy of 92.57 % on the VGG-16 network using the Cifar10 dataset over PVT variations.</p></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2024-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141954598","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An auto-zeroing chopper-stabilized capacitively coupled instrumentation amplifier with 25-Vpp common-mode interference tolerance 具有 25 Vpp 的自动归零斩波稳定电容耦合仪表放大器</mml:msub
IF 1.9 3区 工程技术
Microelectronics Journal Pub Date : 2024-07-20 DOI: 10.1016/j.mejo.2024.106303
{"title":"An auto-zeroing chopper-stabilized capacitively coupled instrumentation amplifier with 25-Vpp common-mode interference tolerance","authors":"","doi":"10.1016/j.mejo.2024.106303","DOIUrl":"10.1016/j.mejo.2024.106303","url":null,"abstract":"<div><p>In this paper, an Electrocardiogram (ECG) signal amplifier with beyond supply rail common-mode interference (CMI) cancellation (CMIC) capability is proposed. The amplifier is composed of a comparator logic, a current source charge pump (CSCP), input pre-charge buffers, and an auto-zeroing (AZ) capacitively coupled chopper instrumentation amplifier (CCIA). The principle and circuit details of the CMI suppression circuit will be analyzed in the article. Based on a standard 180 nm CMOS process, it achieves a 25 <span><math><msub><mrow><mi>V</mi></mrow><mrow><mtext>pp</mtext></mrow></msub></math></span> power line CMI tolerance from a 1.8-V supply. At an input CMI of 4 <span><math><msub><mrow><mi>V</mi></mrow><mrow><mtext>pp</mtext></mrow></msub></math></span>, it consumes 151.91 <span><math><mi>μ</mi></math></span>W, achieves a total harmonic distortion (THD) of -78.8 dB, and has an effective number of bits (ENOB) of 12.02 bits.</p></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2024-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141842476","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Genetic neural network based background calibration method for pipeline ADC 基于遗传神经网络的管道 ADC 背景校准方法
IF 1.9 3区 工程技术
Microelectronics Journal Pub Date : 2024-07-20 DOI: 10.1016/j.mejo.2024.106317
{"title":"Genetic neural network based background calibration method for pipeline ADC","authors":"","doi":"10.1016/j.mejo.2024.106317","DOIUrl":"10.1016/j.mejo.2024.106317","url":null,"abstract":"<div><p>This article presents a pipeline analog-to-digital converter (ADC) background calibration method that combines genetic algorithm (GA) and neural network (NN) algorithm. The proposed method uses ADC outputs or individual stage sub-ADC outputs for NN training, employs GA for global optimization of the NN's initial setup to avoid local optima traps, and utilizes a parallel pipeline architecture to create a high-throughput calibration circuit with optimized multiply-accumulator (MAC) to minimize resource consumption. Through simulation on a 6-stage 14-bit pipelined ADC model, the proposed method demonstrated superiority over traditional calibration techniques and other NN-based calibration strategies. Specifically, after calibration, the signal-to-noise ratio (SNDR), spurious-free dynamic range (SFDR), and effective number of bits (ENOB) are significantly improved from 57.72 dB, 59.77 dB, and 8.79 bits to 104.61 dB, 152.64 dB, and 17.08 bits, respectively.</p></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2024-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141731790","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Source/drain extension asymmetric counter-doping for suppressing channel leakage in stacked nanosheet transistors 源极/漏极扩展非对称反掺杂抑制叠层纳米片晶体管中的沟道泄漏
IF 1.9 3区 工程技术
Microelectronics Journal Pub Date : 2024-07-20 DOI: 10.1016/j.mejo.2024.106347
{"title":"Source/drain extension asymmetric counter-doping for suppressing channel leakage in stacked nanosheet transistors","authors":"","doi":"10.1016/j.mejo.2024.106347","DOIUrl":"10.1016/j.mejo.2024.106347","url":null,"abstract":"<div><p>In the relentless pursuit of semiconductor device scaling, stacked silicon nanosheet gate-all-around field-effect transistors (NSFETs) are emerging as key candidates for sub-3nm technology nodes. However, the challenge of channel leakage in these devices is critical and necessitates innovative solutions. A novel SDE asymmetric counter-doping technique is proposed in this study. It investigates the impact of source/drain extension on device performance using different process schemes through three-dimensional technical computer-aided design (3D TCAD) simulations. The simulations demonstrate a comprehensive technically advantages for 25.2 %/16.65 % reduction in the off-state leakage, 27.36 %/15.03 % improvement in the on-off current ratio of N/P NSFETs, respectively. Furthermore, it shows more performance gain as the gate length scaling beyond 3 nm technology nodes. The compatibility of the asymmetric counter-doping method with mainstream NSFET integration flows and its scalability to 10 nm gate lengths indicate that it is a promising approach to optimize NSFETs performance with little extra process cost.</p></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2024-07-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141845939","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Quantized CNN-based efficient hardware architecture for real-time hand gesture recognition 基于量化 CNN 的实时手势识别高效硬件架构
IF 1.9 3区 工程技术
Microelectronics Journal Pub Date : 2024-07-19 DOI: 10.1016/j.mejo.2024.106345
{"title":"Quantized CNN-based efficient hardware architecture for real-time hand gesture recognition","authors":"","doi":"10.1016/j.mejo.2024.106345","DOIUrl":"10.1016/j.mejo.2024.106345","url":null,"abstract":"<div><p>Nowadays, Convolutional Neural Networks (CNN) have been widely adopted for vision-based hand gesture recognition. Several existing CNN architectures designed for gesture classification perform well with high accuracy but require a high memory footprint and processing when deployed on low-power embedded devices. To address this issue, we present a quantized CNN-based efficient framework for meeting real-life hand gesture recognition challenges. The proposed quantized CNN is designed and implemented using the FINN-based pipelined streaming architecture on an FPGA. Moreover, hardware-based optimizations are used to minimize the resources needed and to achieve fast memory access. Experimental results demonstrate that the developed recognition system achieves an average accuracy of 92% on the numeral database of Indian Sign Language (ISL). Additionally, our optimized design attains an inference latency of 0.85ms for real-time single gesture prediction on the PYNQ Zynq Ultrascale (ZU) FPGA, consuming only 3.63 W of power. The proposed design achieves a better trade-off between hardware resource utilization and speed performance, over previous designs.</p></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2024-07-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141951257","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An ICMR-enhanced three-opamp instrumentation amplifier ICMR 增强型三功放仪表放大器
IF 1.9 3区 工程技术
Microelectronics Journal Pub Date : 2024-07-18 DOI: 10.1016/j.mejo.2024.106342
{"title":"An ICMR-enhanced three-opamp instrumentation amplifier","authors":"","doi":"10.1016/j.mejo.2024.106342","DOIUrl":"10.1016/j.mejo.2024.106342","url":null,"abstract":"<div><p>The three-operational amplifiers (three-opamp) structure is a widely used topology to design precision instrumentation amplifiers (IAs). However, the input common-mode range (ICMR) of the classical three-opamp IA is limited to the output voltage range of the internal operational amplifiers, resulting in the output voltage range being constrained by the input common-mode voltage. This article proposes an ICMR-enhanced three-opamp topology, which constructs a common-mode feedback (CMFB) loop at the first stage of the IA, enabling the first stage has the capability of common-mode rejection. Hence, the proposed ICMR-enhanced three-opamp IA overcomes the limitation of ICMR, eliminates the constraint of the output voltage range and improves the common-mode rejection ratio (CMRR). The proposed circuit was designed and simulated using complementary bipolar process. The simulation results showed that the output voltage range remains constant regardless of the input common-mode voltages, the CMRR is greater than 150 dB, and the Gain Bandwidth Product (GBW) was 4.1 MHz. The advantages of the proposed ICMR-enhanced three-opamp IA will enable its use in more environments.</p></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":null,"pages":null},"PeriodicalIF":1.9,"publicationDate":"2024-07-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S1879239124000468/pdfft?md5=5fc710a9fd171c502f7eb7cb0709cd5c&pid=1-s2.0-S1879239124000468-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141849684","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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