{"title":"Analysis and prediction of bending-torsion coupled stress in BGA stacked solder joints considering interaction effects","authors":"Jingcheng Mo, Chunyue Huang, Chao Gao, Gui Wang","doi":"10.1016/j.mejo.2025.106838","DOIUrl":null,"url":null,"abstract":"<div><div>A finite element model of BGA stacked solder joints was established, and finite element simulation analysis of bending-torsion coupled stress and strain was conducted. A testing platform for measuring bending-torsion coupled strain was constructed to validate the accuracy of the simulation. The solder joint diameter, pad diameter, and solder joint height were selected as influencing factors, and an orthogonal table considering the interactions between these factors was designed and established. The maximum bending-torsion coupled stress for 18 different combinations of structural parameter levels in BGA stacked solder joints was obtained, and range and variance analyses of the stress were performed. A multiple nonlinear regression prediction model for the bending-torsion coupled stress of BGA stacked solder joints was established. The results indicate that the order of influence of the factors and their interactions on the bending-torsion coupled stress of BGA stacked solder joints is as follows: solder joint diameter <span><math><mo>></mo></math></span> pad diameter <span><math><mo>></mo></math></span> solder joint height <span><math><mo>></mo></math></span> interaction between pad diameter and solder joint height <span><math><mo>></mo></math></span> interaction between solder joint diameter and solder joint height <span><math><mo>></mo></math></span> interaction between solder joint diameter and pad diameter. At a confidence level of 99%, the solder joint diameter, pad diameter, and solder joint height have a significant effect on the bending-torsion coupled stress of BGA stacked solder joints, while the interactions among these three structural parameters have an insignificant effect on the bending-torsion coupled stress. The established multiple nonlinear regression prediction model can accurately predict the bending-torsion coupled stress of BGA stacked solder joints, with a maximum error of 2.47% and an average error of 0.95% for the mathematical model.</div></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":"165 ","pages":"Article 106838"},"PeriodicalIF":1.9000,"publicationDate":"2025-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1879239125002875","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
A finite element model of BGA stacked solder joints was established, and finite element simulation analysis of bending-torsion coupled stress and strain was conducted. A testing platform for measuring bending-torsion coupled strain was constructed to validate the accuracy of the simulation. The solder joint diameter, pad diameter, and solder joint height were selected as influencing factors, and an orthogonal table considering the interactions between these factors was designed and established. The maximum bending-torsion coupled stress for 18 different combinations of structural parameter levels in BGA stacked solder joints was obtained, and range and variance analyses of the stress were performed. A multiple nonlinear regression prediction model for the bending-torsion coupled stress of BGA stacked solder joints was established. The results indicate that the order of influence of the factors and their interactions on the bending-torsion coupled stress of BGA stacked solder joints is as follows: solder joint diameter pad diameter solder joint height interaction between pad diameter and solder joint height interaction between solder joint diameter and solder joint height interaction between solder joint diameter and pad diameter. At a confidence level of 99%, the solder joint diameter, pad diameter, and solder joint height have a significant effect on the bending-torsion coupled stress of BGA stacked solder joints, while the interactions among these three structural parameters have an insignificant effect on the bending-torsion coupled stress. The established multiple nonlinear regression prediction model can accurately predict the bending-torsion coupled stress of BGA stacked solder joints, with a maximum error of 2.47% and an average error of 0.95% for the mathematical model.
期刊介绍:
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.
The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.
Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.