IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.最新文献_第3页

On the evaluation of real life test expert systems 现实生活测试专家系统评价研究

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81113

M. Ben-Bassat, D. Ben-Aire, I. Ben-Zvi, I. Beniaminy, J. Cheifetz, O. Horovitz, M. Sela, M. Shalev

{"title":"On the evaluation of real life test expert systems","authors":"M. Ben-Bassat, D. Ben-Aire, I. Ben-Zvi, I. Beniaminy, J. Cheifetz, O. Horovitz, M. Sela, M. Shalev","doi":"10.1109/AUTEST.1989.81113","DOIUrl":"https://doi.org/10.1109/AUTEST.1989.81113","url":null,"abstract":"The authors consider the factors affecting the successful integration of expert systems (ESs) in testing and maintenance environments. The first factor considered has to do with the communication between the ES and the UUT (unit under test) expert and between the ES and the test technician. The authors discuss the importance of embedding in the expert system basic understanding of electronic terms and universal knowledge bases, i.e. knowledge which is not unique to a specific UUT. The second factor considered has to do with the communication between the ES and the ATE (automatic test equipment). It is claimed that artificial intelligence software will not penetrate the real-world test industry, unless it offers very smooth interfaces with test instrumentation and ATE. Several specific requirements are discussed. This work is based on extensive experience in introducing the AITEST expert system for electronic troubleshooting and service management to a wide variety of fields; including aerospace and military, automotive, computers and peripherals, communication and general instrumentation.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114291096","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

An investigation of neural networks for F-16 fault diagnosis. I. System description 神经网络在F-16故障诊断中的研究。一、系统描述

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81147

R. McDuff, P. K. Simpson, D. Gunning

{"title":"An investigation of neural networks for F-16 fault diagnosis. I. System description","authors":"R. McDuff, P. K. Simpson, D. Gunning","doi":"10.1109/AUTEST.1989.81147","DOIUrl":"https://doi.org/10.1109/AUTEST.1989.81147","url":null,"abstract":"The authors report results of ongoing research exploring the use of artificial neural networks (ANNs) for F-16 flight line diagnostics. ANNs hold the promise of solving difficult logistics problems such as multiple fault diagnosis, prognostication, changing configurations and environments, and inaccurate diagnosis attributable to incomplete and/or flawed rules. The authors tested three representative ANNs to see which type worked best for the problem considered. The authors chose back propagation (BPN) and counterpropagation (CPN) because they are considered to be two of the more promising pattern matching paradigms. The binary adaptive resonance theory I (ART1) was also chosen because it learns faster than CPN or BPN and has online adaptation (i.e. does not have to be totally retrained every time a new pattern is discovered). Online adaptation is a powerful attribute, allowing new associations to be immediately incorporated into the knowledge base on the flight line or wherever needed. The authors explain the advantages and drawbacks to each network tested and describe how they were trained using historical flight line data. Of the three ANNs examined, ART1 proved to be the most appropriate and was able to produce multiple-symptom-to-multiple-fault diagnoses.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"79 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134108434","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 13

Modular software for VME/VXI subsystems VME/VXI子系统的模块化软件

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81109

R. Hughes, E. Miller, C. Riall

引用次数: 0

Automatic analog circuit test strategist: the application of artificial intelligence to the generation of ATE software 自动模拟电路测试策略:应用人工智能生成ATE软件

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81110

L. Marinelli, R. Small

引用次数: 2

System level BIT: a tool for MATE test station self maintenance 系统级BIT:用于MATE测试站自我维护的工具

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81132

J. Seeger

引用次数: 1

A digital maintenance information (DMI) system for ATE 数字化维修信息(DMI)系统

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81133

T. Landers, M. Nguyen, R. Delgado

引用次数: 2

System engineering considerations and methodology for effecting a cohesive functional/parametric testing strategy 影响内聚功能/参数测试策略的系统工程考虑和方法

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81091

M. Granieri

引用次数: 0

Concurrent engineering: an overview for Autotestcon 并行工程:Autotestcon概述

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81104

J. P. Pennell, R. I. Winner, H. E. Bertrand, M. Slusarczuk

引用次数: 14

BIT and testability for millimeter wave systems 毫米波系统的比特和可测试性

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81129

D. W. Gillespie, K. Wilkinson, B. Merrell

引用次数: 0

Use of application specific integrated circuits in developing downsized instrumentation 应用专用集成电路开发小型化仪器

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81106

R.J. Burnitis, R. Koelling

引用次数: 0