{"title":"毫米波系统的比特和可测试性","authors":"D. W. Gillespie, K. Wilkinson, B. Merrell","doi":"10.1109/AUTEST.1989.81129","DOIUrl":null,"url":null,"abstract":"The authors provide a basis for understanding BIT related and MMW (millimeter wave) system attributes which offer potential for transportability of current RF/microwave BIT concepts. A comparison of MMW and microwave technology provides a basis for identifying areas where there may be opportunity for the transfer of microwave BIT technology and testability techniques to MMW as well as areas where there is need for new MMW BIT technology development. The authors also describe the current status of device technology, design tools, and implementation techniques applicable to MMW BIT. It is noted that the advent of total MMW systems fabricated on a single monolithic substrate greatly increases the importance of testability and BIT.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"BIT and testability for millimeter wave systems\",\"authors\":\"D. W. Gillespie, K. Wilkinson, B. Merrell\",\"doi\":\"10.1109/AUTEST.1989.81129\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors provide a basis for understanding BIT related and MMW (millimeter wave) system attributes which offer potential for transportability of current RF/microwave BIT concepts. A comparison of MMW and microwave technology provides a basis for identifying areas where there may be opportunity for the transfer of microwave BIT technology and testability techniques to MMW as well as areas where there is need for new MMW BIT technology development. The authors also describe the current status of device technology, design tools, and implementation techniques applicable to MMW BIT. It is noted that the advent of total MMW systems fabricated on a single monolithic substrate greatly increases the importance of testability and BIT.<<ETX>>\",\"PeriodicalId\":321804,\"journal\":{\"name\":\"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-09-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1989.81129\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1989.81129","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The authors provide a basis for understanding BIT related and MMW (millimeter wave) system attributes which offer potential for transportability of current RF/microwave BIT concepts. A comparison of MMW and microwave technology provides a basis for identifying areas where there may be opportunity for the transfer of microwave BIT technology and testability techniques to MMW as well as areas where there is need for new MMW BIT technology development. The authors also describe the current status of device technology, design tools, and implementation techniques applicable to MMW BIT. It is noted that the advent of total MMW systems fabricated on a single monolithic substrate greatly increases the importance of testability and BIT.<>