IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.最新文献

Portability issues in MATE software MATE软件中的可移植性问题

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81114

D. Koppel

{"title":"Portability issues in MATE software","authors":"D. Koppel","doi":"10.1109/AUTEST.1989.81114","DOIUrl":"https://doi.org/10.1109/AUTEST.1989.81114","url":null,"abstract":"The MATE software has been ported onto a variety of different computer architectures under a number of different operating systems. Several of these projects are taken as case studies to illustrate the difficulties encountered and the techniques used to deal with them. Four types of projects are considered: rehosting the MOS (MATE operating system) to a new 1750 A platform with various peripheral suites (systems have been Multibus based and VMEbus based); porting the MTE (MATE test executive) to a VAX/VHS environment; porting the MAC (MATE ATLAS compiler), MOLE (MATE on-line editor), and MTE to a 80286/Xenix environment; and porting the MAC, MOLE, and MTE to a 80286/DOS environment. Each project is analyzed in terms of work inherently necessary by the nature of the task, work made necessary by peculiarities in the target environment, and work associated with the development environment. Timesaving techniques used during development are highlighted. A special subsection is included which discusses the advantages that could have been realized had the original work been done in Ada. The application of Ada in the port process is also discussed.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125072615","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Auxiliary power unit maintenance aid-flight line engine diagnostics 辅助动力单元维修-辅助飞行线路发动机诊断

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81137

P. McCown, T. Conway, C. V. Conway

引用次数: 3

Extending VXIbus systems across multiple-mainframe 跨多主机扩展vxi总线系统

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81125

R. Wolfe

引用次数: 0

Interfacing to boundary scan chips for system level BIT 接口到边界扫描芯片的系统级比特

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81139

J. Turino

引用次数: 0

A standardized instrument programming language based on IEEE STD 488.2 一种基于IEEE STD 488.2的标准化仪器编程语言

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81144

J. Nemeth-Johannes

{"title":"A standardized instrument programming language based on IEEE STD 488.2","authors":"J. Nemeth-Johannes","doi":"10.1109/AUTEST.1989.81144","DOIUrl":"https://doi.org/10.1109/AUTEST.1989.81144","url":null,"abstract":"The author describes the features of the Test and Measurement System Language (TMSL) and how they relate to compatibility. TMSL implements a tree-structured command set, rather than a traditional flat instrument language, allowing keywords to be reusable and identifiable in context. Reusable keywords allow for simple and regular mnemonic generation rules. TMSL has also addressed parameters through the use of regular parameter forms, a say-what-you-mean philosophy for discrete switch setting and the minimization of obscure side effects. TMSL addresses the need for horizontally compatible, signal oriented measurements, as well as the traditional programming of the specific instrument-specific hardware. The author also discusses a model of an instrument developed for TMSL and the importance of such a standardized model. He outlines the advantages realized, including the ease of adding capabilities in the future, the ease of learning, the self-documenting features, the opportunities for reuse of instrument firmware including increased reliability of parsers, and the ease of integrating instruments into existing test systems.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121599768","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Reasoning from uncertain data: a bit enhancement 从不确定数据进行推理:稍微增强了一点

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81112

L.J. Cooper, D.E. Smith

引用次数: 1

Providing Ada based test program and soft panel instrument controls 提供基于Ada的测试程序和软面板仪表控制

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81119

J. Ziegler, J. M. Grasso, L. Burgermeister, L.D. Mollod

{"title":"Providing Ada based test program and soft panel instrument controls","authors":"J. Ziegler, J. M. Grasso, L. Burgermeister, L.D. Mollod","doi":"10.1109/AUTEST.1989.81119","DOIUrl":"https://doi.org/10.1109/AUTEST.1989.81119","url":null,"abstract":"The capabilities of the Universal Ada Test Language (UATL) have been expanded. The UATL was rehosted to an HP Model 9000/Series 300 processor, and a set of test program generation and soft panel instrument control functions were added. HP's interactive test generator (ITG) includes ASCII instrument driver files that characterize the instrument functions and define interactive soft-panel control screens for developing test programs in BASIC. UATL/Ada-based instrument and operator screen control procedures have been written that provide similar functions for generating test programs in Ada. UATL provides a complete set of test support functions in Ada for performing closed-loop testing of a unit-under-test through its external interfaces. In addition to the instrument control functions, the UATL provides real-time digital stimulus/response controls over software or hardware interfaces, online test control and performance monitoring, data recording, and both ASCII and graphical data reduction. Ada introduces the advantages of portability and reusability, extensive data consistency checking, and built-in multitasking support.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125744313","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

Smart built-in-test (BIT): an overview 智能内置测试(BIT):概述

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81101

V.G. Zourides

引用次数: 11

Optical system spectral transmission measurements in the visible and infrared 光学系统测量可见光和红外线的光谱透射

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81128

E. Mei, D. Gallinger

{"title":"Optical system spectral transmission measurements in the visible and infrared","authors":"E. Mei, D. Gallinger","doi":"10.1109/AUTEST.1989.81128","DOIUrl":"https://doi.org/10.1109/AUTEST.1989.81128","url":null,"abstract":"A commercial system designed for measuring detector spectral response was modified for automated testing of optical systems and subassemblies. The modified system provides test capability for large and complicated optics that are not supported by commercially available transmission test systems that test only witness samples or small optical assemblies. The modifications to the commercial hardware and software are described. Illustrations are given for single- and double-pass measurements of various optical systems. The performance capabilities of the new system are described along with methods used to validate the results. The usefulness of the new system is demonstrated by showing how systematic measurements on a complicated infrared imaging lens system were used to identify specific corrective actions. Measurements at the system and subsystem levels provide three unique optical system diagnostic capabilities: measurement of degradation due to time and environmental effects; system-, subsystem-, and component-level troubleshooting; and improved measurement accuracy by preventing error accumulation for multiple-element optical assemblies.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123772526","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Two-level maintenance concept for advanced avionics architectures 先进航空电子架构的两级维护概念

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81102

Kevin C. Judge

引用次数: 4