光学系统测量可见光和红外线的光谱透射

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI:10.1109/AUTEST.1989.81128

E. Mei, D. Gallinger

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引用次数: 2

摘要

设计用于测量探测器光谱响应的商业系统进行了改进，用于光学系统和组件的自动化测试。改进后的系统为大型和复杂的光学系统提供了测试能力，而商用传输测试系统只测试见证样品或小型光学组件。描述了对商用硬件和软件的修改。给出了各种光学系统的单路和双路测量的实例。描述了新系统的性能以及用于验证结果的方法。通过展示如何在复杂的红外成像透镜系统上进行系统测量来确定具体的纠正措施，证明了新系统的实用性。系统和子系统级别的测量提供了三种独特的光学系统诊断能力:由于时间和环境影响的退化测量;系统级、子系统级和组件级故障排除;通过防止多元件光学组件的误差累积，提高了测量精度。

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Optical system spectral transmission measurements in the visible and infrared

A commercial system designed for measuring detector spectral response was modified for automated testing of optical systems and subassemblies. The modified system provides test capability for large and complicated optics that are not supported by commercially available transmission test systems that test only witness samples or small optical assemblies. The modifications to the commercial hardware and software are described. Illustrations are given for single- and double-pass measurements of various optical systems. The performance capabilities of the new system are described along with methods used to validate the results. The usefulness of the new system is demonstrated by showing how systematic measurements on a complicated infrared imaging lens system were used to identify specific corrective actions. Measurements at the system and subsystem levels provide three unique optical system diagnostic capabilities: measurement of degradation due to time and environmental effects; system-, subsystem-, and component-level troubleshooting; and improved measurement accuracy by preventing error accumulation for multiple-element optical assemblies.<>

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来源期刊

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.

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