IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.最新文献_第6页

The integrated support station (ISS): a modular Ada-based test system to support AN/ALE-47 countermeasure dispenser system testing, evaluation, and reprogramming 综合支持站(ISS):一个模块化的基于数据的测试系统，支持AN/ALE-47对抗分配器系统测试、评估和重新编程

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81105

G. Valentino

引用次数: 0

Automated application software generator 自动化应用软件生成器

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81117

B. A. Meyer

引用次数: 2

New directions in loaded board testing 承载板试验的新方向

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81123

J. Berger

引用次数: 0

Fault tolerant engineering methodology and the impact on ATE 容错工程方法及其对自动测试系统的影响

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.1989.81107

D.C. Doskocil

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引用次数: 0

From a sow's ear-quantitative diagnostic design requirements from anecdotal references 来自母猪的耳朵——来自轶事参考的定量诊断设计要求

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.1989.81120

J. Anderson

引用次数: 0

IFTE RF path loss compensation at run time enhances system self-maintenance IFTE运行时射频路径损耗补偿增强了系统的自维护性

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.1989.81134

D.P. Palenchar

引用次数: 0

Tester-assisted built in test 测试人员辅助的内置测试

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1900-01-01 DOI: 10.1109/AUTEST.1989.81141

K. Guntheroth

引用次数: 0