测试人员辅助的内置测试

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1900-01-01 DOI:10.1109/AUTEST.1989.81141

K. Guntheroth

{"title":"测试人员辅助的内置测试","authors":"K. Guntheroth","doi":"10.1109/AUTEST.1989.81141","DOIUrl":null,"url":null,"abstract":"It is noted that board makers invest considerable time and money writing extensive self-tests and that this investment can be multiplied by selecting ATE (automatic test equipment) that complements and extends the power of the self-test. The tester can diagnose boards in situations where a fault prevents the self-test from running. If the tester monitors such resources as processor, memory, and I/O, confidence in test results is improved. The tester can be used during development of the self-test and to turn on prototypes before the self-test is complete. The author argues that emulative functional testers outperform other types of ATE on boards with BST (built-in self-test) and lists features of emulative functional testers that are most important to users of BIST.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Tester-assisted built in test\",\"authors\":\"K. Guntheroth\",\"doi\":\"10.1109/AUTEST.1989.81141\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"It is noted that board makers invest considerable time and money writing extensive self-tests and that this investment can be multiplied by selecting ATE (automatic test equipment) that complements and extends the power of the self-test. The tester can diagnose boards in situations where a fault prevents the self-test from running. If the tester monitors such resources as processor, memory, and I/O, confidence in test results is improved. The tester can be used during development of the self-test and to turn on prototypes before the self-test is complete. The author argues that emulative functional testers outperform other types of ATE on boards with BST (built-in self-test) and lists features of emulative functional testers that are most important to users of BIST.<<ETX>>\",\"PeriodicalId\":321804,\"journal\":{\"name\":\"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.\",\"volume\":\"48 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1989.81141\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1989.81141","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

值得注意的是，电路板制造商投入了大量的时间和金钱来编写大量的自检，而这种投资可以通过选择补充和扩展自检功能的ATE(自动测试设备)而成倍增加。测试仪可以在故障导致自检无法运行的情况下对单板进行诊断。如果测试人员监视诸如处理器、内存和I/O这样的资源，测试结果的可信度就会提高。该测试仪可以在自检的开发过程中使用，并在自检完成之前打开原型。作者认为，模拟功能测试仪优于其他类型的主板上的ATE与BST(内置自检)，并列出模拟功能测试仪的特点，是最重要的BIST的用户。

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Tester-assisted built in test

It is noted that board makers invest considerable time and money writing extensive self-tests and that this investment can be multiplied by selecting ATE (automatic test equipment) that complements and extends the power of the self-test. The tester can diagnose boards in situations where a fault prevents the self-test from running. If the tester monitors such resources as processor, memory, and I/O, confidence in test results is improved. The tester can be used during development of the self-test and to turn on prototypes before the self-test is complete. The author argues that emulative functional testers outperform other types of ATE on boards with BST (built-in self-test) and lists features of emulative functional testers that are most important to users of BIST.<>

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IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.

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