IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.最新文献_第5页

Decision criteria for the application of artificial intelligence in two-level maintenance 人工智能在两级维修中的应用决策准则

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81096

T. Wugofski, M.F. Hengstebeck

引用次数: 0

Neural networks in automatic testing of diode protection circuits 神经网络在二极管保护电路自动测试中的应用

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81118

L. Allred

引用次数: 2

Two-level maintenance for missile systems 导弹系统的两级维护

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81146

S. Dallas, J. Jenkins

引用次数: 1

MATE compliant portable test technology emerges 兼容MATE的便携式测试技术应运而生

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81122

C. Wood

引用次数: 1

Configurable detector array test station 可配置探测器阵列检测站

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81126

M. Rodgers, W. Freudenstein

{"title":"Configurable detector array test station","authors":"M. Rodgers, W. Freudenstein","doi":"10.1109/AUTEST.1989.81126","DOIUrl":"https://doi.org/10.1109/AUTEST.1989.81126","url":null,"abstract":"An advanced test station has been developed to test integrated focal plane array (FPA) hardware. This test system is intended to test readouts, sensor chip assemblies, modules, and complete FPAs. The test station was developed in response to existing and anticipated project requirements that exceed the performance capabilities of existing test stations. A new generation test station will require enhanced performance, such as the ability to accommodate increased data rates, generate lower noise drive electronics, and provide improved diagnostic capability. The goal was to develop a test vehicle that was configurable enough to accommodate the projected FPA test requirements for the next several years, thereby eliminating the need for a new design test station for each individual program. Two types of programs were considered when specifying the new test station: development programs where a substantial amount of diagnostic and analysis capability is required, and production programs where test time and ease of use are critical. If a flexible test station design could be achieved, the nonrecurring costs to implement a new program could be greatly reduced, both in test equipment design and in training test personnel.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122190120","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Downsizing with VXIbus: opportunities and limitations in factory, field, and portable environments vxi总线的小型化:工厂、现场和便携式环境中的机遇和限制

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81099

L. Desjardin

引用次数: 4

A software architecture for VXIbus systems vxi总线系统的软件体系结构

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81143

C. Thomsen

引用次数: 1

Measuring system performance characteristics of infrared systems (MRT, MTF, NETD) using automatic test equipment 利用自动测试设备测量红外系统(MRT、MTF、NETD)的系统性能特性

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81127

F. A. Rosell, L. Gibson

{"title":"Measuring system performance characteristics of infrared systems (MRT, MTF, NETD) using automatic test equipment","authors":"F. A. Rosell, L. Gibson","doi":"10.1109/AUTEST.1989.81127","DOIUrl":"https://doi.org/10.1109/AUTEST.1989.81127","url":null,"abstract":"A project is described whose goal is to develop and test image signal processing algorithms and techniques that allow automation of MRT (minimum resolvable temperature) testing. The basis of the automated test system is the premise that the system MTF (modulation transfer function) is a product of the MTFs of each subsystem component. The MTF of the lens and detector are the major factors affecting system MTF. Therefore, for a given forward-looking infrared system, if the detector and lens system remain constant, the system MTF should be constant. Thus, the results of an automated measurement of the system MTF will remain constant relative to the MTF measurement obtained from human observers. If the constant is proven valid, then it can be reasoned that for all subsequent units of identical design, a constant can be applied to allow verification of system critical parameters to be conducted using automated methods of testing with the same or nearly the same confidence levels compared to the older manual methods. This set of data would be far more repeatable and correlate closer to actual field results. The use of a qualified, quantifiable, and repeatable constant results in a more realistic assessment of actual performance and the removal of human subjectivity from the equation.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134399884","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Exploring VXIbus systems and instrumentation 探索vxi总线系统和仪表

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81124

K. Chipperfield

引用次数: 2

Built in test (BIT) in a commercial signal generator 商用信号发生器的内建测试(BIT)

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81140

Gary L. Sprader

引用次数: 0