导弹系统的两级维护

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI:10.1109/AUTEST.1989.81146

S. Dallas, J. Jenkins

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引用次数: 1

摘要

作者描述了对美国军事服务中两级维护计划和两级结构支持的系统开发进行为期一年的分析的初步结果。分析的重点是内置测试/内置测试设备(BIT/BITE)领域现有系统的性能水平，以及有望改善BIT/BITE的相关技术发展，以协助实现两级维护概念。作者总结了在陆军导弹系统中关于BIT/BITE的研究结果，并就如何提高实施两级维护结构的可行性提出了初步建议

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Two-level maintenance for missile systems

The authors describe the preliminary results of a one-year analysis of two-level maintenance initiatives in the US military services and the development of systems supportable by a two-level structure. The analysis focused on the level of performance for existing systems in the area of built-in-test/built-in-test equipment (BIT/BITE) and related technological developments which promise to yield improvements in BIT/BITE to assist in achieving a two-level maintenance concept. The authors summarize the findings regarding BIT/BITE in Army missile systems and provide preliminary recommendations as to what should be done to enhance the feasibility of implementing a two-level maintenance structure.<>

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IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.

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