商用信号发生器的内建测试(BIT)

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI:10.1109/AUTEST.1989.81140

Gary L. Sprader

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引用次数: 0

摘要

介绍了惠普最新系列射频信号发生器产品的内部诊断实现。使用装配级维修支持策略，可以在不使用外部测试设备的情况下快速修复大多数仪器故障。仪器中单个组件的测试是通过一系列模拟多路复用器、具有交流和直流测量能力的内部电压表和内部射频功率表完成的。交互式故障排除模式用于查找组件之间互连中的问题。

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Built in test (BIT) in a commercial signal generator

The implementation of internal diagnostics in Hewlett-Packard's newest series of RF signal generator products is described. Using an assembly-level repair support strategy, it is possible to repair most instrument failures quickly without the use of external test equipment. Testing of individual assemblies in the instrument is done with a series of analog multiplexers, an internal voltmeter with AC and DC measurement capability, and an internal RF power meter. An interactive troubleshooting mode is used to find problems in the interconnections between assemblies.<>

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IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.

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