IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.最新文献_第4页

Fast, real-time, DFT instrument based on VMEbus 基于VMEbus的快速、实时DFT仪器

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81098

J. Snell

引用次数: 2

A systems approach to downsize ATE 精简ATE的系统方法

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81097

R. Goyal

引用次数: 2

Transport of CAE data: a discourse analysis view CAE数据的传输:语篇分析观点

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81103

A. Lowenstein, D. Hall, S. Schlosser, G. Winter

{"title":"Transport of CAE data: a discourse analysis view","authors":"A. Lowenstein, D. Hall, S. Schlosser, G. Winter","doi":"10.1109/AUTEST.1989.81103","DOIUrl":"https://doi.org/10.1109/AUTEST.1989.81103","url":null,"abstract":"The theorems and terminology of discourse analysis are used to illuminate important issues and clarify areas of controversy associated with the transport of electronic data. This view of data transport reveals that an ATE (automatic test equipment) of CAE (computer-aided engineering) database is never independent of the tools or environment which create and use the data. This lack of independence is shown to compromise the fundamental principles of the traditional implementations of database-centered and three-schema architectures. A consequence is the 'premature geriatric diseases' which commonly degrade such approaches. Solutions based on the lessons learned from discourse analysis are proposed. The importance of performing a deterministic well-defined mapping, i.e. isomorphic mapping, is explained. The use of orthogonal systems, when possible, guarantees that such a mapping can be performed. Netlists are shown to have special attributes which facilitate mapping. An approach to the creation of standards is proposed that constrains the use of nonorthogonal standards, such as computer languages, to express data. Thereby, the transport becomes, or at least approaches, a deterministic well-defined mapping.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122826473","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Logistics impacts and influences of ATE designed to meet the TLM concept 为满足TLM概念而设计的ATE的物流影响和影响

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81095

W. Bryant, J. Timmons

{"title":"Logistics impacts and influences of ATE designed to meet the TLM concept","authors":"W. Bryant, J. Timmons","doi":"10.1109/AUTEST.1989.81095","DOIUrl":"https://doi.org/10.1109/AUTEST.1989.81095","url":null,"abstract":"The two-level maintenance (TLM) concept is being advocated as a means of increasing support capability and reducing the total cost of system maintenance. Traditionally, the Air Force has used a three level maintenance concept, with a heavy emphasis on base level, in-shop repair. In the 1970s and 1980s, this approach to maintenance and the expanding technology of automated test systems resulted in sophisticated and powerful, but costly and resource-consuming automated test systems being developed and deployed worldwide. With continuing advances in reliability, and emphasis on supportable designs, it is apparent that, under certain combinations of resource costs, item reliability, and usage rates, two levels of maintenance provide more support at less cost and consume less resources than does three-level maintenance. The objective of TLM is to eliminate, when feasible, the base-level repair shop from the maintenance structure. The authors explore the rationale behind and the methods of identifying the optimum level of repair, and explain why it is necessary to analyze the requirements before assigning a particular maintenance task to a certain level of maintenance.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"106 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134512995","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

ATE self test ATE自检

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81135

A. Greenspan

{"title":"ATE self test","authors":"A. Greenspan","doi":"10.1109/AUTEST.1989.81135","DOIUrl":"https://doi.org/10.1109/AUTEST.1989.81135","url":null,"abstract":"The ability of automatic test equipment (ATE) to introspectively assess its own well-being as well as assess the well-being of the UUTs (units under test) external to itself has long been understood to be a major advantage of offline ATE. The author argues that this inherent potential ATE system capability has not been used effectively. It has been treated as an afterthought and implemented by the most prosaic of methods. The results of this inadequate and inappropriate treatment of ATE self-test has been stagnation in improved MTBF of new ATE systems and regression in MTTR. The maintenance and training problems for new and modern ATE have been exacerbated rather than reduced. The author contends that this situation is a result of neglect and apathy on the part of ATE systems developers who have failed to be innovative or attentive to modern system techniques in the design of self-test for their ATE. The author proposes a five-phase ATE self-test approach that he hopes can resolve the above-mentioned problems. The phases are: pre-ATE planning; ATE planning; self-test implementation; self-test maturity and evaluation; and self-test feedback/archiving.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131385266","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

VHSIC phase 2 test requirements for the depot 仓库VHSIC阶段2测试要求

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81136

K. Griffin

引用次数: 1

Diagnostic tree design with model-based reasoning 基于模型推理的诊断树设计

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81115

D. Tong, C. H. Jolly, K.C. Zalondek

引用次数: 5

Digital Maintenance Information (DMI) system 数字维修信息(DMI)系统

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81111

P. Knapp

{"title":"Digital Maintenance Information (DMI) system","authors":"P. Knapp","doi":"10.1109/AUTEST.1989.81111","DOIUrl":"https://doi.org/10.1109/AUTEST.1989.81111","url":null,"abstract":"The objective of the digital maintenance information (DMI) system is to improve the capabilities of maintenance organization by providing generic techniques with an integrated electronic deliverable information system for use with ATE (automatic test equipment). The system integrates multiple maintenance information sources into a single easy-to-use information system. Integrated diagnostics relative to ATE has focused on the improved operator interfaces, embedded training, maintenance aiding, information handling and presentation, and documentation. The author presents a system which integrates these functions into a DMI system. The primary application is the presentation of video, graphic, schematic, and instructional text and data in the form of interactive scripts which are displayed to the ATE operator in a PC environment. These scripts visually demonstrate operator support functions during testing including unit-under-test hookup, alignment and adjustment procedures, probing steps, and repair actions. Embedded training in the use of the system, online help, DMI diagnostics, heuristic data collection and retrieval, and electronic network analysis aides are provided using an integrated expert system.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"42 11","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114006543","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

Two levels vs. three levels of maintenance: the cost 两级维护vs三级维护:成本

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81093

W. Hughes, M. M. Kim, R. M. McGauley, D. Mortin, G. A. Serabo

{"title":"Two levels vs. three levels of maintenance: the cost","authors":"W. Hughes, M. M. Kim, R. M. McGauley, D. Mortin, G. A. Serabo","doi":"10.1109/AUTEST.1989.81093","DOIUrl":"https://doi.org/10.1109/AUTEST.1989.81093","url":null,"abstract":"The authors describe level-of-repair analyses for four major US Army weapon/communication systems using the Optimum Supply and Maintenance Model (OSAMM). The four systems are: Single Channel Objective Tactical Terminal (SCOTT); Global Positioning System (GPS); Single Channel Ground and Airborne Radio System (SINCGARS); and Hawk guided missile. The analyses compare the costs associated with a strict two-level maintenance concept with the resulting costs of other maintenance alternatives (e.g. three- and four-level, with and without screening). The authors identify the sensitivity of the resulting cost to such factors as inaccurate built-in test (BIT); TMDE (test measurement and diagnostic equipment) costs, including test program sets; provisioning levels and supply support measures, including number and placement of test equipment and maintenance personnel; and the impact of repair vs. discard. The cost of each policy is assessed not only in terms of dollars, but also in terms of operational availability and system readiness.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124812621","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

The two level maintenance-I level dilemma 二级维护-一级困境

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81100

S. Kornreich

引用次数: 3