仓库VHSIC阶段2测试要求

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI:10.1109/AUTEST.1989.81136

K. Griffin

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引用次数: 1

摘要

最近发布的第二阶段超高速集成电路(VHSIC)标准表明，VHSIC将工作到100 MHz。作者考察了这些高性能数字电路所需的ATE(自动测试设备)测试能力，以及是否需要新的ATE能力或现有技术是否足够。他的分析表明，使用VHSIC阶段2接口总线(PI总线，tm总线和etm总线)并最大限度地使用系统/模块/集成电路内置测试，25 mhz测试仪可以满足仓库测试要求。此外，总线接口电路设计用于模拟内部/外部事件驱动的VHSIC总线协议的运行速度，促进了这一概念

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VHSIC phase 2 test requirements for the depot

The recently released Phase 2 very high speed integrated circuits (VHSIC) standards show that VHSIC will operate up to 100 MHz. The author examines the ATE (automatic test equipment) test capability that will be required for these high-performance digital circuits and whether new ATE capability will be required or whether present technology will be sufficient. His analysis shows that using the VHSIC Phase 2 interface buses (PI bus, TM-bus, and ETM-bus) and maximizing the use of system/module/IC built-in-test, a 25-MHz tester can satisfy depot test requirements. In addition, bus interface circuits designed to emulate the internal/external event-driven VHSIC bus protocols at operational speeds facilitate this concept.<>

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IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.

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