{"title":"二级维护-一级困境","authors":"S. Kornreich","doi":"10.1109/AUTEST.1989.81100","DOIUrl":null,"url":null,"abstract":"Previous attempts at implementing the two-level maintenance philosophy for Navy aircraft did not prove to be workable, and an 'I' level capability was added at a later stage in at least one major program. In this work, an attempt is made to define the real requirements for a workable two-level system, and some actual cases of what can be done on some major weapon systems in the Navy are shown. Recommendations on how to implement and test for a working weapon system BIT/BITE (built-in-test/built-in-test equipment) are offered along with some criteria to measure success. Additionally, related issues such as design for testability and repair capability are addressed since these items can easily take a back seat or be omitted entirely when driving hard to a two-level maintenance concept.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"The two level maintenance-I level dilemma\",\"authors\":\"S. Kornreich\",\"doi\":\"10.1109/AUTEST.1989.81100\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Previous attempts at implementing the two-level maintenance philosophy for Navy aircraft did not prove to be workable, and an 'I' level capability was added at a later stage in at least one major program. In this work, an attempt is made to define the real requirements for a workable two-level system, and some actual cases of what can be done on some major weapon systems in the Navy are shown. Recommendations on how to implement and test for a working weapon system BIT/BITE (built-in-test/built-in-test equipment) are offered along with some criteria to measure success. Additionally, related issues such as design for testability and repair capability are addressed since these items can easily take a back seat or be omitted entirely when driving hard to a two-level maintenance concept.<<ETX>>\",\"PeriodicalId\":321804,\"journal\":{\"name\":\"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.\",\"volume\":\"56 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-09-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1989.81100\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1989.81100","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Previous attempts at implementing the two-level maintenance philosophy for Navy aircraft did not prove to be workable, and an 'I' level capability was added at a later stage in at least one major program. In this work, an attempt is made to define the real requirements for a workable two-level system, and some actual cases of what can be done on some major weapon systems in the Navy are shown. Recommendations on how to implement and test for a working weapon system BIT/BITE (built-in-test/built-in-test equipment) are offered along with some criteria to measure success. Additionally, related issues such as design for testability and repair capability are addressed since these items can easily take a back seat or be omitted entirely when driving hard to a two-level maintenance concept.<>