vxi总线的小型化:工厂、现场和便携式环境中的机遇和限制

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI:10.1109/AUTEST.1989.81099

L. Desjardin

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引用次数: 4

摘要

作者考察了工厂、现场和便携式环境缩小规模的技术限制，并开发了比较功能密度的指标。对两种小型化vxi总线系统进行了评价。一种是c型系统，具有直流到微波的能力，适用于工厂车间或可移动的ATE(自动测试设备)应用。第二种是b级系统，性能较低，相当于c级系统，去掉了微波功能;适用于可移动、便携式ATE。缩小尺寸的测试设备的实际例子，从电池供电的测试仪机架安装，工厂为基础的测试系统显示和评估。结论是，vxi总线可以大大减少工厂、可运输和便携式ATE的测试系统尺寸。与同等HP-IB机架和堆叠仪器相比，尺寸减少平均约为3比1。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Downsizing with VXIbus: opportunities and limitations in factory, field, and portable environments

The author examines the technical constraints of downsizing for factory, field, and portable environments and develops metrics for comparing functional densities. Two examples of downsized VXIbus systems are evaluated. One is a C-size system with DC to microwave capability for factory floor or transportable ATE (automatic test equipment) applications. The second is a B-size system that is a lower performance equivalent of the C-size system with the microwave functionality removed; it is applicable for transportable and portable ATE. Actual examples of reduced-size test equipment ranging from battery operated testers to rack mounted, factory-based test systems are shown and evaluated. It is concluded that the VXIbus can deliver substantial reductions in test system size for factory, transportable, and portable ATE. Size reduction averages about 3 to 1 over equivalent HP-IB rack and stack instruments.<>

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IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.

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