Exploring VXIbus systems and instrumentation

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI:10.1109/AUTEST.1989.81124

K. Chipperfield

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引用次数: 2

Abstract

The author attempts to increase the awareness of the advanced triggering features offered by VXI and to introduce some new system configurations to potential users. These configurations offer higher performance for repeatability of test, timing accuracy, and system throughput. A discussion of extended start/stop protocol and SYNC100 triggering illustrates how tight timing synchronization between instrument modules results in a high degree of measurement repeatability. In addition, it is noted that dramatic improvements in throughput can be achieved utilizing hardware sequencing where VXI system resources are used to minimize time-consuming intervention by the system controller. A test system comprising a digitizer, an arbitrary waveform generator, and a scanner is discussed, with emphasis on the implementation of extended start/stop protocol and hardware sequencing to potential system applications. Attention is given to the instrument features differentiating these products from their rack and stack counterparts.<>

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探索vxi总线系统和仪表

作者试图提高对VXI提供的高级触发特性的认识，并向潜在用户介绍一些新的系统配置。这些配置为测试的可重复性、定时精度和系统吞吐量提供了更高的性能。对扩展启动/停止协议和SYNC100触发的讨论说明了仪器模块之间的紧密定时同步如何导致高度的测量可重复性。此外，值得注意的是，利用硬件排序可以实现吞吐量的显着提高，其中使用VXI系统资源来最大限度地减少系统控制器的耗时干预。讨论了一个由数字化仪、任意波形发生器和扫描器组成的测试系统，重点讨论了扩展启动/停止协议的实现和潜在系统应用的硬件排序。注意仪器的特点，区分这些产品从他们的机架和堆叠对应物

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IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.

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