New directions in loaded board testing

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI:10.1109/AUTEST.1989.81123

J. Berger

{"title":"New directions in loaded board testing","authors":"J. Berger","doi":"10.1109/AUTEST.1989.81123","DOIUrl":null,"url":null,"abstract":"The author discusses some of the advances in computer technology that have made possible new techniques for loaded board testing. Two entirely new measurement techniques are discussed, both based on advanced computer technology and both suitable for implementation in a second-generation MDA (manufacturing defects analyzer) instrument. These techniques are mathematical guarding and passive chip diagnosis. Mathematical guarding replaces the per-test-point costs of hardware and extensive programming with computer algorithms and computational power. Passive chip diagnosis replaces backdriving, extensive libraries, and programming effort with an expert system. It is concluded that these techniques offer the possibility of constructing a tester which combines all the valuable attributes of the best in-circuit testers with the low cost and minimal programming requirements of simple MDAs. As a bonus, the new tester is compatible with universal grid, low-cost tooling.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1989.81123","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

Abstract

The author discusses some of the advances in computer technology that have made possible new techniques for loaded board testing. Two entirely new measurement techniques are discussed, both based on advanced computer technology and both suitable for implementation in a second-generation MDA (manufacturing defects analyzer) instrument. These techniques are mathematical guarding and passive chip diagnosis. Mathematical guarding replaces the per-test-point costs of hardware and extensive programming with computer algorithms and computational power. Passive chip diagnosis replaces backdriving, extensive libraries, and programming effort with an expert system. It is concluded that these techniques offer the possibility of constructing a tester which combines all the valuable attributes of the best in-circuit testers with the low cost and minimal programming requirements of simple MDAs. As a bonus, the new tester is compatible with universal grid, low-cost tooling.<>

查看原文本刊更多论文

承载板试验的新方向

作者讨论了计算机技术的一些进步，这些进步使负载板测试的新技术成为可能。讨论了两种全新的测量技术，它们都基于先进的计算机技术，并且都适合在第二代MDA(制造缺陷分析仪)仪器中实现。这些技术是数学保护和被动芯片诊断。数学保护用计算机算法和计算能力取代了每个测试点的硬件成本和大量编程。被动芯片诊断取代了反向驱动，广泛的库，并与专家系统编程工作。结论是，这些技术提供了构建一个测试器的可能性，它结合了最好的在线测试器的所有有价值的属性和简单的mda的低成本和最小的编程要求。作为奖励，新的测试仪兼容通用网格，低成本的工具。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.

自引率

0.00%

发文量