{"title":"IFTE RF path loss compensation at run time enhances system self-maintenance","authors":"D.P. Palenchar","doi":"10.1109/AUTEST.1989.81134","DOIUrl":null,"url":null,"abstract":"The US Army Integrated Family Test Equipment (IFTE) provides RF stimulus and measurement from -100 dBm to +40 dBm over a frequency range of 100 Hz to 22 GHz. A power-plane technique is used to compensate for system path loss at test program set (TPS) runtime. This technique has been utilized successfully on a number of automatic test equipment programs to enhance system capability and simplify calibration and self-maintenance requirements. The power-plane technique eliminates the need for system-level calibration, compensates for instrument drift, enhances TPS transportability, enhances detection of minor defects, reduces training requirements, and provides measurement and stimulus utilities.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"689 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1989.81134","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The US Army Integrated Family Test Equipment (IFTE) provides RF stimulus and measurement from -100 dBm to +40 dBm over a frequency range of 100 Hz to 22 GHz. A power-plane technique is used to compensate for system path loss at test program set (TPS) runtime. This technique has been utilized successfully on a number of automatic test equipment programs to enhance system capability and simplify calibration and self-maintenance requirements. The power-plane technique eliminates the need for system-level calibration, compensates for instrument drift, enhances TPS transportability, enhances detection of minor defects, reduces training requirements, and provides measurement and stimulus utilities.<>