从不确定数据进行推理:稍微增强了一点

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI:10.1109/AUTEST.1989.81112

L.J. Cooper, D.E. Smith

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引用次数: 1

摘要

提出人工智能(AI)原理与强大的贝叶斯统计推断技术相结合，可以成功地应用于内置测试(BIT)技术，并可以显著提高航空电子设备的BIT诊断能力。目标是从BIT提供的可用数据中提取更多信息，而不是扩展它的测试能力。最后以战术空中导航(TACAN)为例进行了说明。

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Reasoning from uncertain data: a bit enhancement

It is proposed that artificial intelligence (AI) principles, coupled with powerful Bayesian statistical inference techniques, can be successfully applied to built-in-test (BIT) technology and can significantly contribute to the improvement of avionics BIT diagnostic capabilities. The goal is to extract more information from available data provided by the BIT, rather than to expand its testing capabilities. The proposed approach is illustrated by a TACAN (tactical air navigation) example.<>

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IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.

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