IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.最新文献_第2页

Unique vehicle technology in active support of two level maintenance (aircraft equipment testing) 独特的整车技术主动支撑二级维修(飞机设备检测)

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81121

R. Britton

引用次数: 0

Intelligent built-in test and stress management 智能内置测试和压力管理

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81131

D.W. Richards, J. Collins

引用次数: 4

Instrument interchangeability through software resource descriptions 仪器互换性通过软件资源描述

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81145

E. Sacher

{"title":"Instrument interchangeability through software resource descriptions","authors":"E. Sacher","doi":"10.1109/AUTEST.1989.81145","DOIUrl":"https://doi.org/10.1109/AUTEST.1989.81145","url":null,"abstract":"IEEE Committee P981 has been actively defining a language and methodology for writing RDs (resource descriptions). The author discusses the makeup and role of RDs, the language used for describing them, and their application in a prototype open-architecture ATE (automatic test equipment) system. It is noted that RDs are intended to describe the interfaces, i.e. the external views, of an instrument. RDs only provide information about how an instrument reacts when stimulated by its environment; they simply describe the cause and its associated effect. They are not intended to describe how an instrument works internally. All RDs are written using the same uniform standard notation. This allows the construction of software that can make use of all manufacturer RDs without modification. With the proper inquiry software, RDs can be used for selecting applicable instruments based on specific test requirements. This application automates instrument selection by computerizing the manual catalog search process. Another use of the RD could be to answer specific questions about the specifications for a given instrument without needing to consult the instrument manuals.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"179 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134287946","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

A test and maintenance architecture demonstrated on SEM-E modules for fiber optic networks 介绍了一种基于SEM-E模块的光纤网络测试与维护体系结构

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81130

C. A. Jensen, J. H. Corley

引用次数: 1

Now we have ATE: who's going to maintain it? 现在我们有了ATE:谁来维护它?

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81142

D. Grant

引用次数: 0

POINTER-an intelligent maintenance aid 指针——智能维护助手

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81094

W. Simpson, J. Sheppard, C. R. Unkle

{"title":"POINTER-an intelligent maintenance aid","authors":"W. Simpson, J. Sheppard, C. R. Unkle","doi":"10.1109/AUTEST.1989.81094","DOIUrl":"https://doi.org/10.1109/AUTEST.1989.81094","url":null,"abstract":"After eight years of development and application, the ARINC Research Corporation System Testability and Maintenance Program (STAMP) has been expanded to provide a portable, intelligent, interactive diagnostic tool-the portable interactive troubleshooter (POINTER). POINTER is an artificially intelligent, portable maintenance aid that utilizes the STAMP system model, test choice, and inference algorithms to provide a dynamically tailored fault-isolation process. With POINTER, the user may declare test results, hypothesize failures, and override or delay the specified test, and have POINTER select another test to perform. During fault isolation, the user receives the fault identification and may request repair procedures, isolation recap with verification procedures, or a variety of analyses for multiple failures. In addition to the ability to dynamically tailor the fault-isolation session to the current situation, the user has access to a complete explanation facility. POINTER logs the entire analysis and can modify its search strategy by incorporating, through a learning algorithm, the actual test times and failure rates experienced.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"2014 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114885464","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 7

TPS evolution and test software development in the two-level maintenance environment 两级维护环境下的TPS演进与测试软件开发

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81138

J. Scully

引用次数: 4

Testability: the state of the art-automatic testing in the next decade and the 21st century 可测试性:未来十年和21世纪自动测试技术的发展状况

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81116

D. Droste, W. Parsons

引用次数: 1

A modern approach to digital fault simulation 数字故障仿真的一种现代方法

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81108

P. Erath, R. Loretz

引用次数: 1

Test program development using multiple test strategies 使用多种测试策略开发测试程序

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI: 10.1109/AUTEST.1989.81092

G. Robinson

引用次数: 0