{"title":"现在我们有了ATE:谁来维护它?","authors":"D. Grant","doi":"10.1109/AUTEST.1989.81142","DOIUrl":null,"url":null,"abstract":"The authors discuss original equipment manufacturer maintenance and self-maintenance with emphasis on hardware maintenance of in-circuit ATE (automatic test equipment). Issues such as software and fixture maintenance are also addressed. Maintenance is analyzed from an economics standpoint, and issues of jeopardy and practicality are discussed.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Now we have ATE: who's going to maintain it?\",\"authors\":\"D. Grant\",\"doi\":\"10.1109/AUTEST.1989.81142\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors discuss original equipment manufacturer maintenance and self-maintenance with emphasis on hardware maintenance of in-circuit ATE (automatic test equipment). Issues such as software and fixture maintenance are also addressed. Maintenance is analyzed from an economics standpoint, and issues of jeopardy and practicality are discussed.<<ETX>>\",\"PeriodicalId\":321804,\"journal\":{\"name\":\"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.\",\"volume\":\"46 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-09-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1989.81142\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1989.81142","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The authors discuss original equipment manufacturer maintenance and self-maintenance with emphasis on hardware maintenance of in-circuit ATE (automatic test equipment). Issues such as software and fixture maintenance are also addressed. Maintenance is analyzed from an economics standpoint, and issues of jeopardy and practicality are discussed.<>