介绍了一种基于SEM-E模块的光纤网络测试与维护体系结构

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI:10.1109/AUTEST.1989.81130

C. A. Jensen, J. H. Corley

{"title":"介绍了一种基于SEM-E模块的光纤网络测试与维护体系结构","authors":"C. A. Jensen, J. H. Corley","doi":"10.1109/AUTEST.1989.81130","DOIUrl":null,"url":null,"abstract":"The authors describe a general-purpose test and maintenance architecture for electronic subsystems and its demonstration in several avionics SEM-E modules for fiber-optic networking of the Advanced Tactical Fighter, A-12, and other modern aircraft. The results of applying this test and maintenance architecture are delineated in terms of payoff, penalty, and problems encountered. Industry efforts needed to eliminate some of the problems encountered are discussed.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"53 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A test and maintenance architecture demonstrated on SEM-E modules for fiber optic networks\",\"authors\":\"C. A. Jensen, J. H. Corley\",\"doi\":\"10.1109/AUTEST.1989.81130\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors describe a general-purpose test and maintenance architecture for electronic subsystems and its demonstration in several avionics SEM-E modules for fiber-optic networking of the Advanced Tactical Fighter, A-12, and other modern aircraft. The results of applying this test and maintenance architecture are delineated in terms of payoff, penalty, and problems encountered. Industry efforts needed to eliminate some of the problems encountered are discussed.<<ETX>>\",\"PeriodicalId\":321804,\"journal\":{\"name\":\"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.\",\"volume\":\"53 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-09-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1989.81130\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1989.81130","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

作者描述了一种用于电子子系统的通用测试和维护体系结构，并在先进战术战斗机、a -12和其他现代飞机的光纤网络的几个航空电子SEM-E模块中进行了演示。应用这个测试和维护体系结构的结果是根据收益、损失和遇到的问题来描述的。讨论了消除遇到的一些问题所需的行业努力。

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A test and maintenance architecture demonstrated on SEM-E modules for fiber optic networks

The authors describe a general-purpose test and maintenance architecture for electronic subsystems and its demonstration in several avionics SEM-E modules for fiber-optic networking of the Advanced Tactical Fighter, A-12, and other modern aircraft. The results of applying this test and maintenance architecture are delineated in terms of payoff, penalty, and problems encountered. Industry efforts needed to eliminate some of the problems encountered are discussed.<>

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IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.

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