{"title":"使用多种测试策略开发测试程序","authors":"G. Robinson","doi":"10.1109/AUTEST.1989.81092","DOIUrl":null,"url":null,"abstract":"Multistrategy testing allows the test developer to choose the appropriate combination of test approaches to meet the test requirements given the economic and timescale constraints. After describing the goals of test program development, the author discusses major styles of testing, connectivity tests, digital and analog functional tests, analog and digital in-circuit tests, emulation tests, and structured design for testability. Other issues considered are architecture support for multistrategy testing, modular test structures, and separate test execution and diagnosis.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Test program development using multiple test strategies\",\"authors\":\"G. Robinson\",\"doi\":\"10.1109/AUTEST.1989.81092\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Multistrategy testing allows the test developer to choose the appropriate combination of test approaches to meet the test requirements given the economic and timescale constraints. After describing the goals of test program development, the author discusses major styles of testing, connectivity tests, digital and analog functional tests, analog and digital in-circuit tests, emulation tests, and structured design for testability. Other issues considered are architecture support for multistrategy testing, modular test structures, and separate test execution and diagnosis.<<ETX>>\",\"PeriodicalId\":321804,\"journal\":{\"name\":\"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.\",\"volume\":\"38 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-09-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1989.81092\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1989.81092","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Test program development using multiple test strategies
Multistrategy testing allows the test developer to choose the appropriate combination of test approaches to meet the test requirements given the economic and timescale constraints. After describing the goals of test program development, the author discusses major styles of testing, connectivity tests, digital and analog functional tests, analog and digital in-circuit tests, emulation tests, and structured design for testability. Other issues considered are architecture support for multistrategy testing, modular test structures, and separate test execution and diagnosis.<>
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