{"title":"可测试性:未来十年和21世纪自动测试技术的发展状况","authors":"D. Droste, W. Parsons","doi":"10.1109/AUTEST.1989.81116","DOIUrl":null,"url":null,"abstract":"The use of MIL-STD-2165 is a requirement on all new DoD weapon systems contracts. The authors discuss the major highlights of implementing a design-for-testability program, with particular attention paid to the 200 Series tasks for shop replacement assemblies, and describe the standard's effects on actual weapon systems designs. They outline specific approaches that can be used by the weapon systems designer to ensure compliance to the testability guides, possible enhancements to MIL-STD-2165 Appendix B, and design strategies to remedy the problems associated with testing new designs in an effective, efficient manner.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"288 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Testability: the state of the art-automatic testing in the next decade and the 21st century\",\"authors\":\"D. Droste, W. Parsons\",\"doi\":\"10.1109/AUTEST.1989.81116\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The use of MIL-STD-2165 is a requirement on all new DoD weapon systems contracts. The authors discuss the major highlights of implementing a design-for-testability program, with particular attention paid to the 200 Series tasks for shop replacement assemblies, and describe the standard's effects on actual weapon systems designs. They outline specific approaches that can be used by the weapon systems designer to ensure compliance to the testability guides, possible enhancements to MIL-STD-2165 Appendix B, and design strategies to remedy the problems associated with testing new designs in an effective, efficient manner.<<ETX>>\",\"PeriodicalId\":321804,\"journal\":{\"name\":\"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.\",\"volume\":\"288 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-09-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1989.81116\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1989.81116","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Testability: the state of the art-automatic testing in the next decade and the 21st century
The use of MIL-STD-2165 is a requirement on all new DoD weapon systems contracts. The authors discuss the major highlights of implementing a design-for-testability program, with particular attention paid to the 200 Series tasks for shop replacement assemblies, and describe the standard's effects on actual weapon systems designs. They outline specific approaches that can be used by the weapon systems designer to ensure compliance to the testability guides, possible enhancements to MIL-STD-2165 Appendix B, and design strategies to remedy the problems associated with testing new designs in an effective, efficient manner.<>