Two-level maintenance concept for advanced avionics architectures

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI:10.1109/AUTEST.1989.81102

Kevin C. Judge

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引用次数: 4

Abstract

The advanced avionic architecture for next-generation military aircraft will feature common signal- and data-processing modules. The common modules will incorporate VHSIC technology and feature extensive built-in-test (BIT) and error logging capabilities. These new technologies present an opportunity to eliminate the intermediate level of maintenance because self-diagnosed modules can be routed directly to the depot. The author describes a support philosophy which, through BIT capabilities and a factory/depot tester architecture, makes the two-level maintenance concept possible. He explains how to exploit the modules' ability to test themselves and the resultant effect on the support equipment requirements. He then discusses a MATE implementation of the depot tester and addresses issues such as hardware/software modularity, the selection of the controller and instrumentation, and the use of ATLAS versus Ada as the test program language.<>

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先进航空电子架构的两级维护概念

下一代军用飞机的先进航空电子架构将采用通用信号和数据处理模块。通用模块将集成VHSIC技术，并具有广泛的内置测试(BIT)和错误记录功能。这些新技术提供了消除中间维护水平的机会，因为自诊断模块可以直接路由到仓库。作者描述了一种支持理念，通过BIT功能和工厂/仓库测试架构，使两级维护概念成为可能。他解释了如何利用模块的能力来测试自己和对支持设备要求产生的影响。然后，他讨论了仓库测试器的MATE实现，并解决了硬件/软件模块化、控制器和仪表的选择以及使用ATLAS与Ada作为测试程序语言等问题

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.

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