系统级BIT:用于MATE测试站自我维护的工具

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI:10.1109/AUTEST.1989.81132

J. Seeger

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引用次数: 1

摘要

作者研究了在MATE环境中可以做些什么来减少自测运行时间，同时提供更多的故障检测和隔离。他的解决方案涉及VMEbus扩展仪器(VXI总线)技术和现有的BIT(内置测试)技术的集成。这种集成产生了一个系统级的BIT，能够利用集成的测试站资源，将BIT硬件/固件开销降至最低。此外，在系统级BIT期间收集的数据可用于补偿仪器漂移和路径损耗，减少了测试站仪器的常规校准和校准频率。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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System level BIT: a tool for MATE test station self maintenance

The author examines what can be done in a MATE environment to reduce self-test runtime and at the same time provide increased fault detection and isolation. His solution involves the integration of VMEbus extension for instrumentation (VXI bus) technology and existing BIT (built-in-test) techniques. This integration produces a system-level BIT capable of utilizing integrated test station resources to keep the BIT hardware/firmware overhead to a minimum. In addition, data collected during system level BIT can be used to compensate for instrument drift and path loss, reducing the frequency of routine calibration and alignment of test station instruments.<>

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IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.

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