BIT and testability for millimeter wave systems

D. W. Gillespie, K. Wilkinson, B. Merrell
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Abstract

The authors provide a basis for understanding BIT related and MMW (millimeter wave) system attributes which offer potential for transportability of current RF/microwave BIT concepts. A comparison of MMW and microwave technology provides a basis for identifying areas where there may be opportunity for the transfer of microwave BIT technology and testability techniques to MMW as well as areas where there is need for new MMW BIT technology development. The authors also describe the current status of device technology, design tools, and implementation techniques applicable to MMW BIT. It is noted that the advent of total MMW systems fabricated on a single monolithic substrate greatly increases the importance of testability and BIT.<>
毫米波系统的比特和可测试性
作者为理解比特相关和毫米波系统属性提供了基础,为当前射频/微波比特概念的可移植性提供了潜力。毫米波和微波技术的比较为确定可能有机会将微波比特技术和可测试性技术转移到毫米波的领域以及需要开发新毫米波比特技术的领域提供了基础。作者还介绍了适用于毫米波比特的器件技术、设计工具和实现技术的现状。值得注意的是,在单片衬底上制造的全毫米波系统的出现大大增加了可测试性和比特的重要性。
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