现实生活测试专家系统评价研究

M. Ben-Bassat, D. Ben-Aire, I. Ben-Zvi, I. Beniaminy, J. Cheifetz, O. Horovitz, M. Sela, M. Shalev
{"title":"现实生活测试专家系统评价研究","authors":"M. Ben-Bassat, D. Ben-Aire, I. Ben-Zvi, I. Beniaminy, J. Cheifetz, O. Horovitz, M. Sela, M. Shalev","doi":"10.1109/AUTEST.1989.81113","DOIUrl":null,"url":null,"abstract":"The authors consider the factors affecting the successful integration of expert systems (ESs) in testing and maintenance environments. The first factor considered has to do with the communication between the ES and the UUT (unit under test) expert and between the ES and the test technician. The authors discuss the importance of embedding in the expert system basic understanding of electronic terms and universal knowledge bases, i.e. knowledge which is not unique to a specific UUT. The second factor considered has to do with the communication between the ES and the ATE (automatic test equipment). It is claimed that artificial intelligence software will not penetrate the real-world test industry, unless it offers very smooth interfaces with test instrumentation and ATE. Several specific requirements are discussed. This work is based on extensive experience in introducing the AITEST expert system for electronic troubleshooting and service management to a wide variety of fields; including aerospace and military, automotive, computers and peripherals, communication and general instrumentation.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"On the evaluation of real life test expert systems\",\"authors\":\"M. Ben-Bassat, D. Ben-Aire, I. Ben-Zvi, I. Beniaminy, J. Cheifetz, O. Horovitz, M. Sela, M. Shalev\",\"doi\":\"10.1109/AUTEST.1989.81113\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors consider the factors affecting the successful integration of expert systems (ESs) in testing and maintenance environments. The first factor considered has to do with the communication between the ES and the UUT (unit under test) expert and between the ES and the test technician. The authors discuss the importance of embedding in the expert system basic understanding of electronic terms and universal knowledge bases, i.e. knowledge which is not unique to a specific UUT. The second factor considered has to do with the communication between the ES and the ATE (automatic test equipment). It is claimed that artificial intelligence software will not penetrate the real-world test industry, unless it offers very smooth interfaces with test instrumentation and ATE. Several specific requirements are discussed. This work is based on extensive experience in introducing the AITEST expert system for electronic troubleshooting and service management to a wide variety of fields; including aerospace and military, automotive, computers and peripherals, communication and general instrumentation.<<ETX>>\",\"PeriodicalId\":321804,\"journal\":{\"name\":\"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.\",\"volume\":\"62 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-09-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.1989.81113\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1989.81113","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

作者考虑了影响专家系统在测试和维护环境中成功集成的因素。考虑的第一个因素与ES和UUT(被测单元)专家之间以及ES和测试技术人员之间的沟通有关。作者讨论了在专家系统中嵌入对电子术语和通用知识库的基本理解的重要性,即不局限于特定UUT的知识。第二个考虑的因素与ES和ATE(自动测试设备)之间的通信有关。有人声称,人工智能软件将不会渗透到现实世界的测试行业,除非它提供非常流畅的测试仪器和ATE接口。讨论了几个具体的要求。这项工作是基于将AITEST专家系统引入各种领域的电子故障排除和服务管理的丰富经验;包括航空航天和军事、汽车、计算机和外围设备、通信和通用仪器。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
On the evaluation of real life test expert systems
The authors consider the factors affecting the successful integration of expert systems (ESs) in testing and maintenance environments. The first factor considered has to do with the communication between the ES and the UUT (unit under test) expert and between the ES and the test technician. The authors discuss the importance of embedding in the expert system basic understanding of electronic terms and universal knowledge bases, i.e. knowledge which is not unique to a specific UUT. The second factor considered has to do with the communication between the ES and the ATE (automatic test equipment). It is claimed that artificial intelligence software will not penetrate the real-world test industry, unless it offers very smooth interfaces with test instrumentation and ATE. Several specific requirements are discussed. This work is based on extensive experience in introducing the AITEST expert system for electronic troubleshooting and service management to a wide variety of fields; including aerospace and military, automotive, computers and peripherals, communication and general instrumentation.<>
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信