On the evaluation of real life test expert systems

IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. Pub Date : 1989-09-25 DOI:10.1109/AUTEST.1989.81113

M. Ben-Bassat, D. Ben-Aire, I. Ben-Zvi, I. Beniaminy, J. Cheifetz, O. Horovitz, M. Sela, M. Shalev

{"title":"On the evaluation of real life test expert systems","authors":"M. Ben-Bassat, D. Ben-Aire, I. Ben-Zvi, I. Beniaminy, J. Cheifetz, O. Horovitz, M. Sela, M. Shalev","doi":"10.1109/AUTEST.1989.81113","DOIUrl":null,"url":null,"abstract":"The authors consider the factors affecting the successful integration of expert systems (ESs) in testing and maintenance environments. The first factor considered has to do with the communication between the ES and the UUT (unit under test) expert and between the ES and the test technician. The authors discuss the importance of embedding in the expert system basic understanding of electronic terms and universal knowledge bases, i.e. knowledge which is not unique to a specific UUT. The second factor considered has to do with the communication between the ES and the ATE (automatic test equipment). It is claimed that artificial intelligence software will not penetrate the real-world test industry, unless it offers very smooth interfaces with test instrumentation and ATE. Several specific requirements are discussed. This work is based on extensive experience in introducing the AITEST expert system for electronic troubleshooting and service management to a wide variety of fields; including aerospace and military, automotive, computers and peripherals, communication and general instrumentation.<<ETX>>","PeriodicalId":321804,"journal":{"name":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.1989.81113","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

Abstract

The authors consider the factors affecting the successful integration of expert systems (ESs) in testing and maintenance environments. The first factor considered has to do with the communication between the ES and the UUT (unit under test) expert and between the ES and the test technician. The authors discuss the importance of embedding in the expert system basic understanding of electronic terms and universal knowledge bases, i.e. knowledge which is not unique to a specific UUT. The second factor considered has to do with the communication between the ES and the ATE (automatic test equipment). It is claimed that artificial intelligence software will not penetrate the real-world test industry, unless it offers very smooth interfaces with test instrumentation and ATE. Several specific requirements are discussed. This work is based on extensive experience in introducing the AITEST expert system for electronic troubleshooting and service management to a wide variety of fields; including aerospace and military, automotive, computers and peripherals, communication and general instrumentation.<>

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现实生活测试专家系统评价研究

作者考虑了影响专家系统在测试和维护环境中成功集成的因素。考虑的第一个因素与ES和UUT(被测单元)专家之间以及ES和测试技术人员之间的沟通有关。作者讨论了在专家系统中嵌入对电子术语和通用知识库的基本理解的重要性，即不局限于特定UUT的知识。第二个考虑的因素与ES和ATE(自动测试设备)之间的通信有关。有人声称，人工智能软件将不会渗透到现实世界的测试行业，除非它提供非常流畅的测试仪器和ATE接口。讨论了几个具体的要求。这项工作是基于将AITEST专家系统引入各种领域的电子故障排除和服务管理的丰富经验;包括航空航天和军事、汽车、计算机和外围设备、通信和通用仪器。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.

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