Use of application specific integrated circuits in developing downsized instrumentation

Abstract

Application-specific integrated circuits (ASICs) have been used to dramatically reduce the size, weight, and power consumption of instrumentation. The authors present methods used in implementing ASICs for analog and digital built-in tests. Techniques to reduce or eliminate switching requirements and to supply clocking and synchronization functions for downsized test applications are shown. Packaging considerations and pitfalls for built-in-test ASICs are discussed. Accuracy, speed, size, and power consumption characteristics that have been achieved to date and future planned developments are provided.<>