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2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)最新文献

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Single Event Effects Characterization of Microchip’s Programmable Current Limiting Power Switch LX7712 微芯片可编程限流电源开关LX7712的单事件效应表征
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325845
M. Leuenberger, M. Sureau, Russell Stevens, N. Rezzak, Dorian Johnson
{"title":"Single Event Effects Characterization of Microchip’s Programmable Current Limiting Power Switch LX7712","authors":"M. Leuenberger, M. Sureau, Russell Stevens, N. Rezzak, Dorian Johnson","doi":"10.1109/REDW51883.2020.9325845","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325845","url":null,"abstract":"The Heavy Ions Single Event Effect characterization results of Microchip Technology’s radiation hardened programmable current limiting power switch IC, the LX7712, are presented. The data shown are based on Single Event campaign of November 2019.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"98 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115016146","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
NASA Goddard Space Flight Center’s Compendium of Radiation Effects Test Results 美国宇航局戈达德太空飞行中心的辐射效应测试结果纲要
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325841
Alyson D. Topper, J. Lauenstein, E. Wilcox, M. Berg, M. Campola, M. Casey, E. Wyrwas, M. O’Bryan, Thomas A. Carstens, Caroline M. Fedele, J. Forney, Hak S. Kim, Jason M. Osheroff, A. Phan, Max F. Chaiken, Donna J. Cochran, J. Pellish, Peter J. Majewicz
{"title":"NASA Goddard Space Flight Center’s Compendium of Radiation Effects Test Results","authors":"Alyson D. Topper, J. Lauenstein, E. Wilcox, M. Berg, M. Campola, M. Casey, E. Wyrwas, M. O’Bryan, Thomas A. Carstens, Caroline M. Fedele, J. Forney, Hak S. Kim, Jason M. Osheroff, A. Phan, Max F. Chaiken, Donna J. Cochran, J. Pellish, Peter J. Majewicz","doi":"10.1109/REDW51883.2020.9325841","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325841","url":null,"abstract":"Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FETs, flash memory, FPGAs, optoelectronics, digital, analog, and bipolar devices.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131959368","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Proton-Induced Output Clock SEU and SEFI Characterization of the ADC12D1620 12-Bit Analog-to-Digital Converter ADC12D1620 12位模数转换器的质子感应输出时钟SEU和SEFI特性
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325829
R. Dungan, Eric B. Nakamura, T. Tran, Jared Myers, J. J. Parker, Fernan Suela
{"title":"Proton-Induced Output Clock SEU and SEFI Characterization of the ADC12D1620 12-Bit Analog-to-Digital Converter","authors":"R. Dungan, Eric B. Nakamura, T. Tran, Jared Myers, J. J. Parker, Fernan Suela","doi":"10.1109/REDW51883.2020.9325829","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325829","url":null,"abstract":"Proton-induced SEE results are reported for the ADC12D1620. Output clock SEU cross sections were measured over a range of proton energies. No SEFI events were observed at 250 MeV to a fluence of 2.0×1011 p/cm2.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132789810","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Total Dose Performance at High and Low Dose Rate of Switching Regulators 开关调节器在高、低剂量率下的总剂量性能
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325836
D. Hiemstra, S. Shi, L. Chen, V. Kirischian
{"title":"Total Dose Performance at High and Low Dose Rate of Switching Regulators","authors":"D. Hiemstra, S. Shi, L. Chen, V. Kirischian","doi":"10.1109/REDW51883.2020.9325836","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325836","url":null,"abstract":"Results of Cobalt-60 irradiation of switching regulators at high and low dose rates are presented. Performance in the space radiation environment is discussed.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130421711","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Recent Single Event Transients, Upsets, and Latchup Test Results for TPS3307-18, TL1431, INA129, AM26LV31 & 32 Electronic Parts TPS3307-18, TL1431, INA129, AM26LV31和32电子部件的最新单事件瞬变，扰流和锁紧测试结果
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325851
J. Hatch, Brittany Butterworth
{"title":"Recent Single Event Transients, Upsets, and Latchup Test Results for TPS3307-18, TL1431, INA129, AM26LV31 & 32 Electronic Parts","authors":"J. Hatch, Brittany Butterworth","doi":"10.1109/REDW51883.2020.9325851","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325851","url":null,"abstract":"Automotive grade parts provide a commercial \"off-the-shelf\" (COTS) active electronic part alternative for application in satellite and launch vehicles. The results of heavy ion induced Single Event Effects (SEE) measured in various automotive parts are put forth for examination. Automotive grade parts provide additional challenge for die / wafer traceability in the fabrication process and, to a lesser extent, operational temperatures.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115020363","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
[Title page] (标题页)
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/redw51883.2020.9325844
{"title":"[Title page]","authors":"","doi":"10.1109/redw51883.2020.9325844","DOIUrl":"https://doi.org/10.1109/redw51883.2020.9325844","url":null,"abstract":"","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123750346","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Single-Event Effects in Power MOSFETs with Mono-energetic Neutron Beams 单能中子束功率mosfet的单事件效应
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325853
J. George, Joshua M. Pritts, T. Fairbanks, S. Wender, E. Auden, H. Quinn
{"title":"Single-Event Effects in Power MOSFETs with Mono-energetic Neutron Beams","authors":"J. George, Joshua M. Pritts, T. Fairbanks, S. Wender, E. Auden, H. Quinn","doi":"10.1109/REDW51883.2020.9325853","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325853","url":null,"abstract":"Neutron-induced single event burnout was measured in power MOSFET devices using mono-energetic neutron beams at the Triangle Universities Nuclear Laboratory.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125855847","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Single Event Effect Evaluation of the Jetson AGX Xavier Module Using Proton Irradiation 质子辐照对Jetson AGX Xavier模块的单事件效应评价
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325840
D. Hiemstra, C. Jin, Z. Li, R. Chen, S. Shi, L. Chen
{"title":"Single Event Effect Evaluation of the Jetson AGX Xavier Module Using Proton Irradiation","authors":"D. Hiemstra, C. Jin, Z. Li, R. Chen, S. Shi, L. Chen","doi":"10.1109/REDW51883.2020.9325840","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325840","url":null,"abstract":"The Single Event Effect (SEE) cross-sections for various operating modes of a Jetson AGX Xavier GPU module were evaluated using proton irradiation. The results show that the error rate can be reduced with redundancy techniques.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114593105","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
SET Results of the Intersil ISL7202xSEH CAN Transceivers in a Two Node Bus System Intersil ISL7202xSEH CAN收发器在双节点总线系统中的测试结果
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325857
W. H. Newman, N. V. van Vonno, A. Robinson, L. Pearce, E. Thomson
{"title":"SET Results of the Intersil ISL7202xSEH CAN Transceivers in a Two Node Bus System","authors":"W. H. Newman, N. V. van Vonno, A. Robinson, L. Pearce, E. Thomson","doi":"10.1109/REDW51883.2020.9325857","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325857","url":null,"abstract":"We report the results of SET testing of a two-node Intersil CAN Bus system. Based on those results, CRÈME96 provided an estimated system error rate in a geosynchronous orbit and a typical low earth orbit.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134374996","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Investigation of Application-Specific Bias Conditions and Dose Rate Dependency in Total Ionizing Dose (TID) Response 总电离剂量(TID)反应中应用特异性偏置条件和剂量率依赖关系的研究
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325830
Amanda N. Bozovich, D. Nguyen, B. Rax, Joe Davila, S. Zajac
{"title":"Investigation of Application-Specific Bias Conditions and Dose Rate Dependency in Total Ionizing Dose (TID) Response","authors":"Amanda N. Bozovich, D. Nguyen, B. Rax, Joe Davila, S. Zajac","doi":"10.1109/REDW51883.2020.9325830","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325830","url":null,"abstract":"This paper investigates flight circuit application bias and irradiation dose rate dependencies (\"test as you fly\" conditions) in the total ionizing dose (TID) response of various electronic components considered for use in a space radiation environment.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"24 6","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131957993","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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