M. Leuenberger, M. Sureau, Russell Stevens, N. Rezzak, Dorian Johnson
{"title":"微芯片可编程限流电源开关LX7712的单事件效应表征","authors":"M. Leuenberger, M. Sureau, Russell Stevens, N. Rezzak, Dorian Johnson","doi":"10.1109/REDW51883.2020.9325845","DOIUrl":null,"url":null,"abstract":"The Heavy Ions Single Event Effect characterization results of Microchip Technology’s radiation hardened programmable current limiting power switch IC, the LX7712, are presented. The data shown are based on Single Event campaign of November 2019.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"98 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Single Event Effects Characterization of Microchip’s Programmable Current Limiting Power Switch LX7712\",\"authors\":\"M. Leuenberger, M. Sureau, Russell Stevens, N. Rezzak, Dorian Johnson\",\"doi\":\"10.1109/REDW51883.2020.9325845\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The Heavy Ions Single Event Effect characterization results of Microchip Technology’s radiation hardened programmable current limiting power switch IC, the LX7712, are presented. The data shown are based on Single Event campaign of November 2019.\",\"PeriodicalId\":127384,\"journal\":{\"name\":\"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)\",\"volume\":\"98 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW51883.2020.9325845\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW51883.2020.9325845","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Single Event Effects Characterization of Microchip’s Programmable Current Limiting Power Switch LX7712
The Heavy Ions Single Event Effect characterization results of Microchip Technology’s radiation hardened programmable current limiting power switch IC, the LX7712, are presented. The data shown are based on Single Event campaign of November 2019.