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2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)最新文献

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SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below 基于90纳米及以下技术的商用和定制设计sram的SEU表征
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325822
A. Coronetti, M. Cecchetto, Jialei Wang, M. Tali, Pablo Fernández Martínez, M. Kastriotou, Athina Papadopoulou, K. Biłko, F. Castellani, Mario Sacristan, R. G. Alía, C. Cazzaniga, Y. Morilla, P. Martín-Holgado, M. van Goethem, H. Kiewiet, Emil van der Graaf, S. Brandenburg, W. Hajdas, L. Šinkūnaitė, M. Marszalek, H. Kettunen, M. Rossi, J. Jaatinen, A. Javanainen, M. Moscatello, A. Dubois, S. Fiore, G. Bazzano, C. Frost, M. Letiche, W. Farabolini, A. Gilardi, R. Corsini, H. Puchner
{"title":"SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below","authors":"A. Coronetti, M. Cecchetto, Jialei Wang, M. Tali, Pablo Fernández Martínez, M. Kastriotou, Athina Papadopoulou, K. Biłko, F. Castellani, Mario Sacristan, R. G. Alía, C. Cazzaniga, Y. Morilla, P. Martín-Holgado, M. van Goethem, H. Kiewiet, Emil van der Graaf, S. Brandenburg, W. Hajdas, L. Šinkūnaitė, M. Marszalek, H. Kettunen, M. Rossi, J. Jaatinen, A. Javanainen, M. Moscatello, A. Dubois, S. Fiore, G. Bazzano, C. Frost, M. Letiche, W. Farabolini, A. Gilardi, R. Corsini, H. Puchner","doi":"10.1109/REDW51883.2020.9325822","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325822","url":null,"abstract":"The R2E project at CERN has tested a few commercial SRAMs and a custom-designed SRAM, whose data are complementary to various scientific publications. The experimental data include low- and high-energy protons, heavy ions, thermal, intermediate- and high-energy neutrons, high-energy electrons and high-energy pions.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117352564","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Heavy Ion-Induced SEE and 60Co TID effects testing on commercial logic devices 商用逻辑器件重离子诱导SEE和60Co TID效应测试
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325826
P. Kohler, A. Bosser, T. Rajkowski, F. Saigné, P. Wang, A. Sanchez, L. Puybusque, L. Gouyet
{"title":"Heavy Ion-Induced SEE and 60Co TID effects testing on commercial logic devices","authors":"P. Kohler, A. Bosser, T. Rajkowski, F. Saigné, P. Wang, A. Sanchez, L. Puybusque, L. Gouyet","doi":"10.1109/REDW51883.2020.9325826","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325826","url":null,"abstract":"This paper presents the investigation of heavy-ion induced Single-Event Effects, and gamma ray induced Total Ionizing Dose effect on commercial logic devices including buffers and transceivers.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"133 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123588221","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Single Event Latchup Results for COTS Devices Used on SmallSat Missions 用于小卫星任务的COTS设备的单事件锁定结果
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325824
Sergeh Vartanian, F. Irom, G. Allen, Wilson P. Parker, Michael O'Connor
{"title":"Single Event Latchup Results for COTS Devices Used on SmallSat Missions","authors":"Sergeh Vartanian, F. Irom, G. Allen, Wilson P. Parker, Michael O'Connor","doi":"10.1109/REDW51883.2020.9325824","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325824","url":null,"abstract":"We present single event latchup (SEL) results for a variety of microelectronic devices frequently designated for SmallSat missions. The data presented is only a small representation of all the SEL tests performed in 2019.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129471469","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Updated Compendium of Total Ionizing Dose (TID) Test Results for the Europa Clipper Mission 更新的欧罗巴快船任务总电离剂量(TID)测试结果纲要
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325858
S. Zajac, Amanda N. Bozovich, B. Rax, Joe Davila, D. Nguyen, Wilson P. Parker, A. Kenna, S. McClure, Jason L. Thomas, Kelly W. Stanford, Mitch J. Sundgaard
{"title":"Updated Compendium of Total Ionizing Dose (TID) Test Results for the Europa Clipper Mission","authors":"S. Zajac, Amanda N. Bozovich, B. Rax, Joe Davila, D. Nguyen, Wilson P. Parker, A. Kenna, S. McClure, Jason L. Thomas, Kelly W. Stanford, Mitch J. Sundgaard","doi":"10.1109/REDW51883.2020.9325858","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325858","url":null,"abstract":"We present the results of total ionizing dose testing and analysis on Electric, Electronic, and Electromechanical (EEE) parts, tested by the Jet Propulsion Laboratory in support of the Europa Clipper Mission.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129894811","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
SEE and TID test results Compilation for Candidate Spacecraft Electronics 候选航天器电子器件SEE和TID测试结果汇编
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325821
A. Kalashnikova, T. A. Maksimenko, Maksim S. Kuznetsov, M. Y. Vyrostkov, Alexandr E. Koziukov, Radic R. Mangushev, A. A. Drokin, Anastasia A. Malova, A. Nilov, Nikolai V. Bondarenko, Kais B. Bu-Khasan, Andrei S. Kukharev
{"title":"SEE and TID test results Compilation for Candidate Spacecraft Electronics","authors":"A. Kalashnikova, T. A. Maksimenko, Maksim S. Kuznetsov, M. Y. Vyrostkov, Alexandr E. Koziukov, Radic R. Mangushev, A. A. Drokin, Anastasia A. Malova, A. Nilov, Nikolai V. Bondarenko, Kais B. Bu-Khasan, Andrei S. Kukharev","doi":"10.1109/REDW51883.2020.9325821","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325821","url":null,"abstract":"the Results of the single effect events and total ionizing dose testing of VCOs, amplifiers, regulators and DC/DC converters are presented. We obtained SOA, LET thresholds and TID for SEL and Destructive Failure.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122810813","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Energy-Dependent Single-Event Effects in Power MOSFETs from a Broad-Spectrum Neutron Beam 广谱中子束作用下功率mosfet的能量依赖单事件效应
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325839
Joshua M. Pritts, S. Wender, J. George, T. Fairbanks, J. O'Donnell
{"title":"Energy-Dependent Single-Event Effects in Power MOSFETs from a Broad-Spectrum Neutron Beam","authors":"Joshua M. Pritts, S. Wender, J. George, T. Fairbanks, J. O'Donnell","doi":"10.1109/REDW51883.2020.9325839","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325839","url":null,"abstract":"We present an approach to extract energy-dependent cross sections from broad-spectrum pulsed neutron beams using time-of-flight measurements. We include data for destructive single-event burnout in several n-channel power MOSFETs.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124945654","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
In-Situ Measurement of the Effect of 1-MeV Electrons Irradiation on III-V//Si at LILT Conditions 在LILT条件下1-MeV电子辐照对III-V//Si影响的原位测量
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325850
Karim Medjoubi, R. Cariou, L. Vauche, E. Veinberg-Vidal, C. Jany, Cedric Rostaing, Vincent Amalbert, F. Chabuel, B. Boizot
{"title":"In-Situ Measurement of the Effect of 1-MeV Electrons Irradiation on III-V//Si at LILT Conditions","authors":"Karim Medjoubi, R. Cariou, L. Vauche, E. Veinberg-Vidal, C. Jany, Cedric Rostaing, Vincent Amalbert, F. Chabuel, B. Boizot","doi":"10.1109/REDW51883.2020.9325850","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325850","url":null,"abstract":"In this study, we investigate the potential of III-V/Si solar cell technology for space applications. We present here the experimental results before and after 1 MeV electrons irradiation at NIRT and LILT conditions.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121909180","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Single-Event Effects Testing of the Renesas ISL70005SEH Dual Output Point-of-Load Regulator 瑞萨ISL70005SEH双输出负载点稳压器的单事件效应测试
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325859
N. V. van Vonno, O. Mansilla, J. S. Gill, W. H. Newman, L. Pearce, E. Thomson
{"title":"Single-Event Effects Testing of the Renesas ISL70005SEH Dual Output Point-of-Load Regulator","authors":"N. V. van Vonno, O. Mansilla, J. S. Gill, W. H. Newman, L. Pearce, E. Thomson","doi":"10.1109/REDW51883.2020.9325859","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325859","url":null,"abstract":"We report the results of destructive and nondestructive single-event effects (SEE) testing of the Renesas ISL70005SEH dual output point-of-load (POL) regulator, which includes a synchronous buck regulator and a low dropout (LDO) regulator in a single integrated circuit. We also provide a brief functional description of the part.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121472604","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Total Dose Testing of the ISL70061SEH and ISL70062SEH PMOS and NMOS Load Switches ISL70061SEH和ISL70062SEH PMOS和NMOS负载开关的总剂量测试
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325856
N. V. van Vonno, W. H. Newman
{"title":"Total Dose Testing of the ISL70061SEH and ISL70062SEH PMOS and NMOS Load Switches","authors":"N. V. van Vonno, W. H. Newman","doi":"10.1109/REDW51883.2020.9325856","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325856","url":null,"abstract":"We report the results of total ionizing dose testing carried out by Renesas Electronics America on the ISL70061SEH (PMOS) and ISL70062SEH (NMOS) load switches. These parts are single channel, low voltage, high current load switches intended for use in space power switching applications. The tests were carried out as a part of baseline total dose hardness characterization carried out during part development. The test also performed biased high temperature anneals after the completion of irradiation at both dose rates to evaluate time dependent effects. Both parts are implemented in a 0.6 micron bulk BiCMOS process.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116433766","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
SEL and TID Characterization of a Cobham Advanced Electronic Solutions SONOS Nonvolatile Memory Cobham先进电子解决方案SONOS非易失性存储器的SEL和TID表征
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325828
M. Von Thun, D. Bass, Radu Dumitru, Rex Anderson, Jack Benthem, Shaw Ashenafi
{"title":"SEL and TID Characterization of a Cobham Advanced Electronic Solutions SONOS Nonvolatile Memory","authors":"M. Von Thun, D. Bass, Radu Dumitru, Rex Anderson, Jack Benthem, Shaw Ashenafi","doi":"10.1109/REDW51883.2020.9325828","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325828","url":null,"abstract":"A Cobham Advanced Electronic Solutions SONOS based Nor Flash non-volatile memory has been designed, manufactured, and characterized for radiation effects. The radiation effects results will be presented.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114597464","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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