广谱中子束作用下功率mosfet的能量依赖单事件效应

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI:10.1109/REDW51883.2020.9325839

Joshua M. Pritts, S. Wender, J. George, T. Fairbanks, J. O'Donnell

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引用次数: 1

摘要

我们提出了一种利用飞行时间测量从广谱脉冲中子束中提取能量相关截面的方法。我们包括了几个n沟道功率mosfet中破坏性单事件烧毁的数据。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Energy-Dependent Single-Event Effects in Power MOSFETs from a Broad-Spectrum Neutron Beam

We present an approach to extract energy-dependent cross sections from broad-spectrum pulsed neutron beams using time-of-flight measurements. We include data for destructive single-event burnout in several n-channel power MOSFETs.

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来源期刊

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)

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