2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)

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2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) - 最新文献

SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below

Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325822 A. Coronetti, M. Cecchetto, Jialei Wang, M. Tali, Pablo Fernández Martínez, M. Kastriotou, Athina Papadopoulou, K. Biłko, F. Castellani, Mario Sacristan, R. G. Alía, C. Cazzaniga, Y. Morilla, P. Martín-Holgado, M. van Goethem, H. Kiewiet, Emil van der Graaf, S. Brandenburg, W. Hajdas, L. Šinkūnaitė, M. Marszalek, H. Kettunen, M. Rossi, J. Jaatinen, A. Javanainen, M. Moscatello, A. Dubois, S. Fiore, G. Bazzano, C. Frost, M. Letiche, W. Farabolini, A. Gilardi, R. Corsini, H. Puchner

Heavy Ion-Induced SEE and 60Co TID effects testing on commercial logic devices

Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325826 P. Kohler, A. Bosser, T. Rajkowski, F. Saigné, P. Wang, A. Sanchez, L. Puybusque, L. Gouyet

Single Event Latchup Results for COTS Devices Used on SmallSat Missions

Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325824 Sergeh Vartanian, F. Irom, G. Allen, Wilson P. Parker, Michael O'Connor

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