SEE and TID test results Compilation for Candidate Spacecraft Electronics

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI:10.1109/REDW51883.2020.9325821

A. Kalashnikova, T. A. Maksimenko, Maksim S. Kuznetsov, M. Y. Vyrostkov, Alexandr E. Koziukov, Radic R. Mangushev, A. A. Drokin, Anastasia A. Malova, A. Nilov, Nikolai V. Bondarenko, Kais B. Bu-Khasan, Andrei S. Kukharev

引用次数: 0

Abstract

the Results of the single effect events and total ionizing dose testing of VCOs, amplifiers, regulators and DC/DC converters are presented. We obtained SOA, LET thresholds and TID for SEL and Destructive Failure.

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候选航天器电子器件SEE和TID测试结果汇编

介绍了vco、放大器、调节器和DC/DC变换器的单效应事件和总电离剂量测试结果。我们得到了SOA、LET阈值以及SEL和破坏性故障的TID。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)

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