Single-Event Effects Testing of the Renesas ISL70005SEH Dual Output Point-of-Load Regulator

Abstract

We report the results of destructive and nondestructive single-event effects (SEE) testing of the Renesas ISL70005SEH dual output point-of-load (POL) regulator, which includes a synchronous buck regulator and a low dropout (LDO) regulator in a single integrated circuit. We also provide a brief functional description of the part.