N. V. van Vonno, O. Mansilla, J. S. Gill, W. H. Newman, L. Pearce, E. Thomson
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Single-Event Effects Testing of the Renesas ISL70005SEH Dual Output Point-of-Load Regulator
We report the results of destructive and nondestructive single-event effects (SEE) testing of the Renesas ISL70005SEH dual output point-of-load (POL) regulator, which includes a synchronous buck regulator and a low dropout (LDO) regulator in a single integrated circuit. We also provide a brief functional description of the part.