商用逻辑器件重离子诱导SEE和60Co TID效应测试

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI:10.1109/REDW51883.2020.9325826

P. Kohler, A. Bosser, T. Rajkowski, F. Saigné, P. Wang, A. Sanchez, L. Puybusque, L. Gouyet

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引用次数: 0

摘要

本文介绍了重离子诱导的单事件效应和伽马射线诱导的总电离剂量效应在商业逻辑器件上的研究，包括缓冲器和收发器。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Heavy Ion-Induced SEE and 60Co TID effects testing on commercial logic devices

This paper presents the investigation of heavy-ion induced Single-Event Effects, and gamma ray induced Total Ionizing Dose effect on commercial logic devices including buffers and transceivers.

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来源期刊

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)

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