基于90纳米及以下技术的商用和定制设计sram的SEU表征

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI:10.1109/REDW51883.2020.9325822

A. Coronetti, M. Cecchetto, Jialei Wang, M. Tali, Pablo Fernández Martínez, M. Kastriotou, Athina Papadopoulou, K. Biłko, F. Castellani, Mario Sacristan, R. G. Alía, C. Cazzaniga, Y. Morilla, P. Martín-Holgado, M. van Goethem, H. Kiewiet, Emil van der Graaf, S. Brandenburg, W. Hajdas, L. Šinkūnaitė, M. Marszalek, H. Kettunen, M. Rossi, J. Jaatinen, A. Javanainen, M. Moscatello, A. Dubois, S. Fiore, G. Bazzano, C. Frost, M. Letiche, W. Farabolini, A. Gilardi, R. Corsini, H. Puchner

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引用次数: 8

摘要

欧洲核子研究中心的R2E项目已经测试了一些商业SRAM和一个定制设计的SRAM，其数据是各种科学出版物的补充。实验数据包括低能和高能质子、重离子、热中子、中能和高能中子、高能电子和高能介子。

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SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below

The R2E project at CERN has tested a few commercial SRAMs and a custom-designed SRAM, whose data are complementary to various scientific publications. The experimental data include low- and high-energy protons, heavy ions, thermal, intermediate- and high-energy neutrons, high-energy electrons and high-energy pions.

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来源期刊

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)

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