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2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)最新文献

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Single Event Transients Detection in AD844 Operational Amplifier by Utilizing Ultra-fast Pulsed Laser System 利用超快脉冲激光系统检测AD844运算放大器中的单事件瞬态
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325852
Cheng Gu, D. Hiemstra, V. Kirischian, Li Chen
{"title":"Single Event Transients Detection in AD844 Operational Amplifier by Utilizing Ultra-fast Pulsed Laser System","authors":"Cheng Gu, D. Hiemstra, V. Kirischian, Li Chen","doi":"10.1109/REDW51883.2020.9325852","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325852","url":null,"abstract":"Single Event Transients (SETs) have been observed in five Region Of Interest (ROI) of AD844 operational amplifier by utilizing ultra-fast laser system with three different energy level through Two Photon Absorption (TPA) process. A SET detecting system is also described.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134123965","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Trend in Measured SEL Sensitivity with Increasing Proton Induced Total Ionizing Dose to1Mrad(Si) on Zynq UltraScale Plus XCZU9EG FPGA Zynq UltraScale Plus XCZU9EG FPGA上质子诱导总电离剂量1mrad (Si)增加时SEL灵敏度的变化趋势
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325854
R. Koga, S. Davis, D. Mabry
{"title":"Trend in Measured SEL Sensitivity with Increasing Proton Induced Total Ionizing Dose to1Mrad(Si) on Zynq UltraScale Plus XCZU9EG FPGA","authors":"R. Koga, S. Davis, D. Mabry","doi":"10.1109/REDW51883.2020.9325854","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325854","url":null,"abstract":"Experimental observation of the trend in SEL sensitivity was made for increasing proton induced TID/DD. The test samples were the Zynq Ultrascale Plus XCZU9EG FPGAs. The cumulative TID on one sample was near 1 Mrad(Si).","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117178766","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
TID Sensor Based on a Bipolar Transistor 基于双极晶体管的TID传感器
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325848
A. Bakerenkov, V. Pershenkov, V. Felitsyn, A. Rodin, V. Telets, V. Belyakov, A. Zhukov, N. Glukhov
{"title":"TID Sensor Based on a Bipolar Transistor","authors":"A. Bakerenkov, V. Pershenkov, V. Felitsyn, A. Rodin, V. Telets, V. Belyakov, A. Zhukov, N. Glukhov","doi":"10.1109/REDW51883.2020.9325848","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325848","url":null,"abstract":"The performance of the total ionizing dose sensor based on a bipolar transistor were researched in this work.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122938065","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Proton Beam Testing of SEU Sensitivity of M430FR5989SRGCREP, EFM32GG11B820F2048, AT32UC3C0512C, and M2S010 Microcontrollers in Low-Earth Orbit 近地轨道上M430FR5989SRGCREP、EFM32GG11B820F2048、AT32UC3C0512C和M2S010微控制器SEU灵敏度的质子束测试
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI: 10.1109/REDW51883.2020.9325842
S. Damkjar, I. Mann, D. Elliott
{"title":"Proton Beam Testing of SEU Sensitivity of M430FR5989SRGCREP, EFM32GG11B820F2048, AT32UC3C0512C, and M2S010 Microcontrollers in Low-Earth Orbit","authors":"S. Damkjar, I. Mann, D. Elliott","doi":"10.1109/REDW51883.2020.9325842","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325842","url":null,"abstract":"Proton beam testing was performed on several microcontrollers using proton energies between 2.4 MeV and 57.6 MeV. A remotely operated robotic testing platform was developed to improve testing throughput by minimizing the need for human intervention in the radiation vault. Sensitivity to SEU, SEL, and SEFI faults was determined. Using the measured SEU cross-section data along with NASA’s radiation belt model, AP8, in-orbit SEU rates were determined for an ISS orbit. Testing was also done while varying the incidence angle of the proton beam which shows that the rate of SEL and SEFI faults increased significantly with shallower incidence angle.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126810753","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Guide to the 2019 IEEE Radiation Effects Data Workshop Record 2019年IEEE辐射效应数据研讨会记录指南
2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2017-07-01 DOI: 10.1109/REDW51883.2020.9325834
D. Hiemstra
{"title":"Guide to the 2019 IEEE Radiation Effects Data Workshop Record","authors":"D. Hiemstra","doi":"10.1109/REDW51883.2020.9325834","DOIUrl":"https://doi.org/10.1109/REDW51883.2020.9325834","url":null,"abstract":"The 2019 Workshop Record has been reviewed and a table prepared to facilitate the search for radiation response data by part number, type, or effect.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129445512","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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