Trend in Measured SEL Sensitivity with Increasing Proton Induced Total Ionizing Dose to1Mrad(Si) on Zynq UltraScale Plus XCZU9EG FPGA

Abstract

Experimental observation of the trend in SEL sensitivity was made for increasing proton induced TID/DD. The test samples were the Zynq Ultrascale Plus XCZU9EG FPGAs. The cumulative TID on one sample was near 1 Mrad(Si).