Single Event Transients Detection in AD844 Operational Amplifier by Utilizing Ultra-fast Pulsed Laser System

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI:10.1109/REDW51883.2020.9325852

Cheng Gu, D. Hiemstra, V. Kirischian, Li Chen

引用次数: 1

Abstract

Single Event Transients (SETs) have been observed in five Region Of Interest (ROI) of AD844 operational amplifier by utilizing ultra-fast laser system with three different energy level through Two Photon Absorption (TPA) process. A SET detecting system is also described.

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利用超快脉冲激光系统检测AD844运算放大器中的单事件瞬态

利用三种不同能级的超快激光系统，通过双光子吸收(TPA)工艺，在AD844运算放大器的5个感兴趣区域(ROI)观测到了单事件瞬态(SETs)。介绍了一种SET检测系统。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)

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