利用超快脉冲激光系统检测AD844运算放大器中的单事件瞬态

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI:10.1109/REDW51883.2020.9325852

Cheng Gu, D. Hiemstra, V. Kirischian, Li Chen

{"title":"利用超快脉冲激光系统检测AD844运算放大器中的单事件瞬态","authors":"Cheng Gu, D. Hiemstra, V. Kirischian, Li Chen","doi":"10.1109/REDW51883.2020.9325852","DOIUrl":null,"url":null,"abstract":"Single Event Transients (SETs) have been observed in five Region Of Interest (ROI) of AD844 operational amplifier by utilizing ultra-fast laser system with three different energy level through Two Photon Absorption (TPA) process. A SET detecting system is also described.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Single Event Transients Detection in AD844 Operational Amplifier by Utilizing Ultra-fast Pulsed Laser System\",\"authors\":\"Cheng Gu, D. Hiemstra, V. Kirischian, Li Chen\",\"doi\":\"10.1109/REDW51883.2020.9325852\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Single Event Transients (SETs) have been observed in five Region Of Interest (ROI) of AD844 operational amplifier by utilizing ultra-fast laser system with three different energy level through Two Photon Absorption (TPA) process. A SET detecting system is also described.\",\"PeriodicalId\":127384,\"journal\":{\"name\":\"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW51883.2020.9325852\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW51883.2020.9325852","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

利用三种不同能级的超快激光系统，通过双光子吸收(TPA)工艺，在AD844运算放大器的5个感兴趣区域(ROI)观测到了单事件瞬态(SETs)。介绍了一种SET检测系统。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Single Event Transients Detection in AD844 Operational Amplifier by Utilizing Ultra-fast Pulsed Laser System

Single Event Transients (SETs) have been observed in five Region Of Interest (ROI) of AD844 operational amplifier by utilizing ultra-fast laser system with three different energy level through Two Photon Absorption (TPA) process. A SET detecting system is also described.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)

自引率

0.00%

发文量