Investigation of Application-Specific Bias Conditions and Dose Rate Dependency in Total Ionizing Dose (TID) Response

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI:10.1109/REDW51883.2020.9325830

Amanda N. Bozovich, D. Nguyen, B. Rax, Joe Davila, S. Zajac

引用次数: 1

Abstract

This paper investigates flight circuit application bias and irradiation dose rate dependencies ("test as you fly" conditions) in the total ionizing dose (TID) response of various electronic components considered for use in a space radiation environment.

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总电离剂量(TID)反应中应用特异性偏置条件和剂量率依赖关系的研究

本文研究了考虑在空间辐射环境中使用的各种电子元件的总电离剂量(TID)响应中的飞行电路应用偏置和辐照剂量率依赖关系(“随飞测试”条件)。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)

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