Alyson D. Topper, J. Lauenstein, E. Wilcox, M. Berg, M. Campola, M. Casey, E. Wyrwas, M. O’Bryan, Thomas A. Carstens, Caroline M. Fedele, J. Forney, Hak S. Kim, Jason M. Osheroff, A. Phan, Max F. Chaiken, Donna J. Cochran, J. Pellish, Peter J. Majewicz
{"title":"NASA Goddard Space Flight Center’s Compendium of Radiation Effects Test Results","authors":"Alyson D. Topper, J. Lauenstein, E. Wilcox, M. Berg, M. Campola, M. Casey, E. Wyrwas, M. O’Bryan, Thomas A. Carstens, Caroline M. Fedele, J. Forney, Hak S. Kim, Jason M. Osheroff, A. Phan, Max F. Chaiken, Donna J. Cochran, J. Pellish, Peter J. Majewicz","doi":"10.1109/REDW51883.2020.9325841","DOIUrl":null,"url":null,"abstract":"Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FETs, flash memory, FPGAs, optoelectronics, digital, analog, and bipolar devices.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW51883.2020.9325841","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include FETs, flash memory, FPGAs, optoelectronics, digital, analog, and bipolar devices.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
