质子辐照对Jetson AGX Xavier模块的单事件效应评价

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI:10.1109/REDW51883.2020.9325840

D. Hiemstra, C. Jin, Z. Li, R. Chen, S. Shi, L. Chen

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引用次数: 3

摘要

采用质子辐照对Jetson AGX Xavier图形处理器模块在不同工作模式下的单事件效应(SEE)横截面进行了评价。结果表明，采用冗余技术可以降低错误率。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Single Event Effect Evaluation of the Jetson AGX Xavier Module Using Proton Irradiation

The Single Event Effect (SEE) cross-sections for various operating modes of a Jetson AGX Xavier GPU module were evaluated using proton irradiation. The results show that the error rate can be reduced with redundancy techniques.

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来源期刊

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)

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