ADC12D1620 12位模数转换器的质子感应输出时钟SEU和SEFI特性

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC) Pub Date : 2020-11-01 DOI:10.1109/REDW51883.2020.9325829

R. Dungan, Eric B. Nakamura, T. Tran, Jared Myers, J. J. Parker, Fernan Suela

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引用次数: 0

摘要

报道了ADC12D1620的质子诱导SEE结果。在质子能量范围内测量输出时钟SEU截面。在2.0×1011 p/cm2影响的250 MeV下未观察到SEFI事件。

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Proton-Induced Output Clock SEU and SEFI Characterization of the ADC12D1620 12-Bit Analog-to-Digital Converter

Proton-induced SEE results are reported for the ADC12D1620. Output clock SEU cross sections were measured over a range of proton energies. No SEFI events were observed at 250 MeV to a fluence of 2.0×1011 p/cm2.

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2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)

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